Effect of surfactants on the morphology of titania microspheres prepared by internal gelation process
- 167 Downloads
Abstract
Internal gelation process was employed for preparation of 0.3–1 mm sized microspheres of titania for their application in ion exchange columns. The conventional internal gelation process was modified by adding surfactant and oil emulsion in the feed broth, which introduced large pores in the structure of the material. The effects of concentration of hydrochloric acid, titanium, surfactant and hexamethylenetetramine to titanium ratio in the feed broth and temperature of calcination on the surface characteristics of the final product were studied. The conditions of preparation were optimized to obtain physically stable porous microspheres suitable for various applications. The resultant material was characterized by pore size distribution, pore volume, thermogravimetry, X-ray diffraction and SEM analyses. Ion exchange behaviour of the material was then studied by pH titration.
Keywords
Surfactant Internal gelation Sol–gel chemistry Titania microspheres Surface properties Thermogravimetric analysisNotes
Acknowledgments
The authors thank Dr S.K. Aggarwal, Associate Director RC&I Group and Head Fuel Chemistry Division for his support and encouragement during the course of investigations as well as for critical evaluation of the manuscript. The authors also express their sincere thanks to Shri R.V. Kamat for useful discussions and valuable suggestions during the course of the work and Shri Sunil Kumar from Post Irradiation & Examination Division for providing SEM photographs of titania microspheres. The authors also express their sincere thanks to Dr. K.Krishnan for XRD analysis and Mrs. Mohini Laghate for pore size distribution data.
References
- 1.Inorganic exchangers and adsorbers for chemical processing in nuclear fuel cycle, IAEA-TECDOC-337(1985)Google Scholar
- 2.S. Pathak, R.D. Bhanushali, I.C. Pius, T.V. Vittal Rao, S.K. Mukerjee, Mater. Res. Bull. 43, 2937 (2008)CrossRefGoogle Scholar
- 3.I.C. Pius, R.D. Bhanushali, K.T. Pillai, S.K. Mukerjee, V.N. Vaidya, J. Radioanal. Nucl. Chem. 240(3), 981 (1999)CrossRefGoogle Scholar
- 4.Y. Xu, X. Zhu, Y. Dan, J.H. Moon, V.W. Chen, A.T. Johnson, J.W. Perry, S. Yang, Chem. Mater. 20, 1816 (2008)CrossRefGoogle Scholar
- 5.X.Z. Li, H. Liu, L.F. Cheng, H.J. Tong, Environ. Sci. Technol. 37, 3989 (2003)CrossRefGoogle Scholar
- 6.J. Kennedy, J.W. Peckett and R. Perkins, UK Atomic Energy Authority, Report AERE-R-4516(1964)Google Scholar
- 7.M. Iwasaki, S.A. Davis, S. Mann, J. Sol-Gel. Sci. Technol. 32, 99 (2004)CrossRefGoogle Scholar
- 8.S. Chaochin, K.F. Lin, Y.H. Lin, B.H. You, J. Porous Mater. 13, 251 (2006)CrossRefGoogle Scholar
- 9.X. Yan, J. He, D.G. Evans, Y. Zhu, X. Duan, J. Porous Mater. 11, 131 (2004)CrossRefGoogle Scholar
- 10.G. Rangel-Porras, E. Ramos-Ramirez, M. Leticia, G. Torres-Guerra, J. Porous Mater. 17, 69 (2009)CrossRefGoogle Scholar
- 11.R.V. Pai, K.T. Pillai, S. Pathak, S.K. Mukerjee, V.V. Vinogradov, A.V. Agafonov, A.V. Vinogradov, S.K. Aggarwal, J. Sol-Gel. Sci. Technol. 61, 192 (2012)CrossRefGoogle Scholar
- 12.V.V. Vinogradov, A.V. Agafonov, A.V. Vinogradov, K.T. Pillai, R.V. Pai, S.K. Mukerjee, S.K. Aggarwal, J. Sol-Gel. Sci. Technol. 60, 6 (2011)CrossRefGoogle Scholar
- 13.J.Q. Qi, Y. Wanga, W.P. Chena, H.Y. Tian, L.T. Li, H.L.W. Chana, J. Alloy. Compd. 413, 307 (2006)CrossRefGoogle Scholar
- 14.V.N. Vaidya, J.K. Joshi, S.K. Mukerjee, R.V. Kamat, J. Nucl. Mat. 148, 324 (1987)CrossRefGoogle Scholar
- 15.V.N. Vaidya, J. Sol-Gel Sci, Technol. 46, 369 (2008)Google Scholar
- 16.D.D. Sood, J. Sol–Gel Sci. Technol. 59, 404 (2011)CrossRefGoogle Scholar
- 17.C. Ganguly, P.V. Hegde, J. Sol–Gel Sci. Technol. 9, 285 (1997)Google Scholar
- 18.R.D. Hunt, J.L. Collins, Radiochim. Acta 92, 909 (2004)CrossRefGoogle Scholar
- 19.J. Radhakrishna, J.V. Dehadraya, S.K. Mukerjee, V.N. Vaidya, V. Venugopal, Transactions of Indian Ceramic Society 60(2), 71 (2001)Google Scholar
- 20.I.C. Pius, R.D. Bhanushali, Y.R. Bamankar, S.K. Mukerjee, V.N. Vaidya, J. Radioanal. Nucl. Chem. 261(3), 547 (2004)CrossRefGoogle Scholar
- 21.J.L. Collins and K.K. Anderson, Report ORNL/TM-2000/367(2000)Google Scholar
- 22.R.V. Pai, S.K. Mukerjee, V.N. Vaidya, J. Nucl. Mat. 325, 159 (2004)CrossRefGoogle Scholar
- 23.C.T. Kresge, M.E. Leonowicz, W.J. Roth, J.C. Vartuli, J.S. Beck, Nature 359, 710 (1992)CrossRefGoogle Scholar
- 24.P.T. Tanev, M. Chibwe, T.J. Pinnavia, Nature 368, 321 (1994)CrossRefGoogle Scholar
- 25.S. Partap, A. Muthutantri, I.U. Rehman, G.R. Davis, J.A. Darr, J. Mater. Sci. 42, 3502 (2007)CrossRefGoogle Scholar
- 26.G.L.J.P. da Silva, M.L.C.P. da Silva, C. Tatiana, Mater. Res. 5, 149 (2002)Google Scholar
- 27.S. Mann, Nature 365, 499 (1993)CrossRefGoogle Scholar
- 28.B.D. Cullity, in Elements of X-ray Diffraction, 2nd edn., ed. by M. Cohen (Addison-Wesley Publishing Co., Reading, MA, 1978), p. 102Google Scholar