Emission and HR-XRD study of InGaAs/GaAs quantum wells with InAs quantum dots grown at different temperatures
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GaAs/In0.15Ga0.85As/GaAs QWs with embedded InAs QDs grown at different temperatures have been studied by means of the photoluminescence (PL), X ray diffraction (XRD) and high resolution XRD (HR-XRD) methods. PL study has detected varying of QD parameters and HR-XRD permits monitoring the QW parameters. It is shown that increasing the QD growth temperature up to 510 °C leads to raising the QD sizes, to shift of QD emission peak to low energy and increasing the PL intensity of QDs. Simultaneously Ga/In atom intermixing is realized mainly between the InGaAs buffer and InAs wetting layers and did not influent on the InAs QD composition. At higher QD growth temperatures (525–535 °C) the PL intensity of QDs decreases significantly together with decreasing the QD heights and the shift of PL peaks into higher energy. Fitting the HR-XRD results has revealed that Ga/In atom intermixing involves the composition changes in buffer and wetting layers, as well as in QDs. The mentioned optical and structural effects have been discussed in details.
The work was supported by CONACYT Mexico (Project 258224) and by SIP-IPN, Mexico (Projects 20170821, 20170667 and 20170854). The authors thank the Dr. A. Stintz from Center of High Technology Materials at University of New Mexico, Albuquerque, USA for growing the studied QD structures.
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