The effect of Au nanocrystals applied in CdS colloidal quantum dots ultraviolet photodetectors

  • Hao Kan
  • Sisi Liu
  • Bing Xie
  • Baohui Zhang
  • Shenglin Jiang
Article
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Abstract

Colloidal quantum dot (CQD) hold great potential in optoelectronic due to low-cost solution processing and exceedingly high absorption efficiency. CdS nanomaterials have attractive potential applications in photodetector owing to their unique physical and chemical properties. In this work, CdS colloidal quantum dots (CQDs) and Au nanocrystals (NCs) were synthesized by hot injection method and the absorbing layer was constructed by Layer-by-layer spin-coating method treated with hexadecyl trimethyl ammonium bromide (CTAB) at room temperature. The response of the photodetector with Au NCs 1% by weight and without Au NCs were 1.27 × 10−4 and 4.96 × 10−5 A/W, respectively. The CdS CQDs photodetector (Au NCs by weight 1%) with detectivity up to 1.42 × 109 Jones was two times than pure CdS CQDs photodetector, that was because Au NCs can effectively suppress the radiation recombination of the photogenerated carriers. This simple binary NCs system provides a simple and effective way for improving the performance of the photodetector.

Keywords

Localize Surface Plasmonic Resonance HgTe Oleylamine Lead Iodide CsPbBr3 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Notes

Acknowledgements

Research described in this paper was supported by National Natural Science Foundation of China (0204182087). We thank the Analytical and Testing Center of HUST and the Center for Nanoscale Characterization & Devices of WNLO for the characterization support. We specially thank associate professor Liu Huan at Huazhong University of Science and Technology for providing the preparation conditions and equipments of nanocomposites materials. And we sincerely thank professor Tang Jiang at Huazhong University of Science and Technology to provide a semiconductor device analyzer for our testing.

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Copyright information

© Springer Science+Business Media New York 2017

Authors and Affiliations

  • Hao Kan
    • 1
  • Sisi Liu
    • 1
  • Bing Xie
    • 1
  • Baohui Zhang
    • 1
  • Shenglin Jiang
    • 1
  1. 1.School of Optical and Electronic InformationHuazhong University of Science and TechnologyWuhanPeople’s Republic of China

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