SiO2–Fe2O3–MoO3 ceramic system doped with Nb2O5, a study of the dielectric temperature dependence
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In this paper the temperature dependence, structure and electrical properties of the ceramic system SiO2–MoO3–Fe2O3:Nb2O5 was studied. This material can be used for temperature sensor applications. The samples with the composition (100 − x)(SiO2–Fe2O3–MoO3) + x(Nb2O5), with x = 0; 0.3; 0.5 (mol%) were prepared through the solid state reaction method. The structure of the samples was analyzed by X-Ray Powder Diffraction together with the Rietveld refinement. Their morphology was studied by scanning electron microscopy with Energy-Dispersive Spectroscopy analysis. The dielectric properties were measured in the frequency range 1 Hz–1 MHz as a function of temperature. The Temperature Capacitance Coefficient was measured for all samples. The obtained results are discussed and correlated with the preparation method.
The authors thank this work to LOCEM (Physics Department, Federal University of Ceará, Brazil) for the use of theirs laboratories for samples preparation and CNPq (Brazilian Agency).
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