Microstructure and varistor properties of V-doped ZnO nanoparticles prepared by co-precipitation method
- 165 Downloads
- 4 Citations
Abstract
V-doped ZnO nanoparticles (0.5, 1, 1.5 and 2 at.% V) for varistor application have been prepared by co-precipitation method. XRD, TEM, EDS, SEM and FTIR have been employed to characterize the as-synthesized V-doped ZnO nanopowders and varistor samples. Pure and V-doped ZnO nanoparticles have a hexagonal wurtzite structure and the (002) diffraction peaks position of V-doped ZnO shift toward smaller value of diffraction angle compared with pure ZnO powders. The results confirm that the V ions were well incorporated into ZnO crystal lattice. Simultaneously, V doping also inhibited the growth of particles and the size decreased from 45.1755 to 29.5137 nm with the increase in doping concentration from 0 to 2 at.%. The microstructure of 2 at.% V-doped ZnO varistor consists mainly of ZnO grains with Zn3(VO4)2 as the minority secondary phase at 900 °C. The varistor ceramics has a sintered density of 5.55 g/cm3 corresponding to 96.2 % of its theoretical density, with breakdown voltage of 4100 V/cm and nonlinear coefficient of ~7.2.
Keywords
Breakdown Voltage Full Width Half Maximum Nonlinear Coefficient Varistor Ceramic Versus DopingNotes
Acknowledgments
This work was financially supported by Changzhou Science, Technology Innovation Project, Nature Science Foundation of China (CC20140048, CC20130204, No. 51273027) and 2014 Research and Innovation Project for College Graduates of Jiangsu Province.
References
- 1.M.P. Lu, J.H. Song, M.Y. Lu, M.T. Chen et al., Nano Lett. 9, 1223–1227 (2009)CrossRefGoogle Scholar
- 2.S.Y. Chu, T.M. Yan, S.L. Chen, Ceram. Int. 26, 733–737 (2000)CrossRefGoogle Scholar
- 3.S. Suwanboon, P. Amornpitoksuk, N. Muensit, Ceram. Int. 37, 2247–2253 (2011)CrossRefGoogle Scholar
- 4.J. Fan, K. Sreekanth, Z. Xie, S. Chang, K. Rao, Prog. Mater Sci. 58, 874–985 (2013)CrossRefGoogle Scholar
- 5.Q. Zhang, C.S. Dandeneau, X. Zhou, G. Cao, Adv. Mater. 21, 1–22 (2009)Google Scholar
- 6.O. Lupan, G. Emelchenko, V. Ursaki et al., Mater. Res. Bull. 45, 1026–1032 (2010)CrossRefGoogle Scholar
- 7.M. Ohyama, H. Kozuka, T. Yoko, J. Am. Ceram. Soc. 81, 1622–1632 (1998)CrossRefGoogle Scholar
- 8.J.L. Li, G.H. Chen, C.L. Yuan, Ceram. Int. 39, 2231–2237 (2013)CrossRefGoogle Scholar
- 9.C.W. Nahm, J. Eur. Ceram. Soc. 23, 1345–1353 (2003)CrossRefGoogle Scholar
- 10.M. Matsuoka, Jpn. J. Appl. Phys. 10, 736–746 (1971)CrossRefGoogle Scholar
- 11.J. Wong, J. Appl. Phys. 51, 4453–4459 (1980)CrossRefGoogle Scholar
- 12.K. Mukae, K. Tsuda, I. Nagasawa, Jpn. J. Appl. Phys. 16, 1361–1368 (1977)CrossRefGoogle Scholar
- 13.A.B. Alles, V.L. Burdick, J. Appl. Phys. 70, 6883–6890 (1991)CrossRefGoogle Scholar
- 14.M. Matsuoka, T. Masuyama, Y. Lida, Jpn. J. Appl. Phys. 8, 1275–1276 (1969)CrossRefGoogle Scholar
- 15.H.H. Hng, K.Y. Tse, Ceram. Int. 34, 1153–1157 (2008)CrossRefGoogle Scholar
- 16.J.K. Tsai, T.B. Wu, Mater. Lett. 26, 199–203 (1996)CrossRefGoogle Scholar
- 17.H.H. Hng, K.M. Knowles, J. Am. Ceram. Soc. 83, 2455–2462 (2000)CrossRefGoogle Scholar
- 18.H.H. Hng, P.L. Chan, Mater. Chem. Phys. 75, 61–66 (2002)CrossRefGoogle Scholar
- 19.J.K. Tsai, T.B. Wu, J. Appl. Phys. 76, 4817–4822 (1994)CrossRefGoogle Scholar
- 20.H.H. Hng, P.L. Chan, Ceram. Int. 35, 409–413 (2009)CrossRefGoogle Scholar
- 21.K.P. Shinde, R.C. Pawar, B.B. Sinha et al., Ceram. Int. 40, 16799–16804 (2014)CrossRefGoogle Scholar
- 22.A. Mhamdi, A. Boukhachem, M. Madani et al., Optik 124, 3764–3770 (2013)CrossRefGoogle Scholar
- 23.J.L. Chen, D. Chen, J.J. He, S.Y. Zhang et al., Appl. Sur. Sci. 255, 9413–9419 (2009)CrossRefGoogle Scholar
- 24.J.H. Lee, B.O. Park, Thin Solid Films 426, 94–99 (2003)CrossRefGoogle Scholar
- 25.H.R. Mardani, M. Forouzani, M. Ziari, P. Biparva, Spectrochim. Acta A 141, 27–33 (2015)CrossRefGoogle Scholar
- 26.A.J. Reddy, M.K. Kokila, H. Nagabhushan et al., J. Alloys Compd. 509, 5349–5355 (2011)CrossRefGoogle Scholar
- 27.S. Senthilkumar, K. Rajendran, S. Banerjee et al., Mater. Sci. Semi. Process 11, 6–12 (2008)CrossRefGoogle Scholar
- 28.G. Murtaza, R. Ahmad, M.S. Rashid, M. Hassan et al., Curr. Appl. Phys. 14, 176–181 (2014)CrossRefGoogle Scholar
- 29.C.W. Nahm, Ceram. Int. 39, 2117–2121 (2013)CrossRefGoogle Scholar
- 30.H.H. Hng, K.M. Knowles, J. Eur. Ceram. Soc. 19, 721–726 (1999)CrossRefGoogle Scholar
- 31.D. Xung, X.N. Cheng, G.P. Zhao, J. Yang, L.Y. Shi, Ceram. Int. 37, 201–206 (2011)CrossRefGoogle Scholar
- 32.M.A. Ashraf, A.H. Bhuiyan, M.A. Hakim, M.T. Hossain, Mater. Sci. Eng. B. 176, 855–860 (2011)CrossRefGoogle Scholar