In situ optical inspection of electrochemical migration during THB tests

  • Bálint Medgyes
  • Balázs Illés
  • Richárd Berényi
  • Gábor Harsányi


In order to get more information about the process of electrochemical migration (ECM), a novel in situ optical inspection system was developed and tested. The optical inspection system is applicable for real time in situ investigation to observe water condensation and dendrite growth during Thermal Humidity Bias (THB) tests. In this paper, a real time observation of water condensation and dendrite growth is studied on immersion silver (iAg), bare copper (Cu) and galvanic tin (gSn) interdigital (double comb) patterns prepared on FR4 substrate during Dew Point THB test. The real time in situ optical investigations were verified by real time voltage measurements, which are presented in the paper as well. The result shows that the water condensation mainly starts on the metal surface, which is an unexpected phenomenon since the preliminary condition of ECM is the presence of a continuous moisture film between the metallization stripes, e.g. on the surface of the insulation board material.


Dendrite Growth Water Condensation Conductor Line Optical Inspection Electrochemical Migration 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



This work is connected to the scientific program of the “Development of quality-oriented and harmonized R+D+I strategy and functional model at BME” project. This project is supported by the New Hungary Development Plan (Project ID: TÁMOP-4.2.1/B-09/1/KMR-2010-0002).


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Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Bálint Medgyes
    • 1
  • Balázs Illés
    • 1
  • Richárd Berényi
    • 1
  • Gábor Harsányi
    • 1
  1. 1.Department of Electronics TechnologyBudapest University of Technology and EconomicsBudapestHungary

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