Editorial

  • Patrick McNally
Article
  • 20 Downloads

Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Patrick McNally
    • 1
  1. 1.Proceedings of the 5th International Conference on Materials for Microelectronics and Nanoengineering (MFMN2004), 13–14 September, 2004University of SouthamptonSouthamptonUK

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