Journal of Materials Science

, Volume 46, Issue 12, pp 4157–4161 | Cite as

Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures

  • Jaume Gazquez
  • Maria Varela
  • Daniela Petti
  • Matteo Cantoni
  • Christian Rinaldi
  • Stefano Brivio
  • Riccardo Bertacco
IIB 2010


Aberration correction in the scanning transmission electron microscope combined with electron energy loss spectroscopy allows simultaneous mapping of the structure, the chemistry and even the electronic properties of materials in one single experiment with spatial resolutions of the order of one Ångström. Here the authors will apply these techniques to the characterization of epitaxial Fe/MgO/(001)Ge and interfaces with possible applications for tunneling junctions, and the authors will show that epitaxial MgO films can be grown on a (001)Ge substrates by molecular beam epitaxy and how it is possible to map the chemistry of interfaces with atomic resolution.


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Copyright information

© Springer Science+Business Media, LLC (outside the USA) 2011

Authors and Affiliations

  • Jaume Gazquez
    • 1
    • 2
  • Maria Varela
    • 1
  • Daniela Petti
    • 3
  • Matteo Cantoni
    • 3
  • Christian Rinaldi
    • 3
  • Stefano Brivio
    • 3
  • Riccardo Bertacco
    • 3
  1. 1.Oak Ridge National LaboratoryOak RidgeUSA
  2. 2.Department Física Aplicada IIIUniversity Complutense of MadridMadridSpain
  3. 3.Dipartimento di Fisica—Politecnico di MilanoL-NESSComoItaly

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