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Journal of Materials Science

, Volume 44, Issue 10, pp 2610–2616 | Cite as

Filament poisoning at typical carbon nanotube deposition conditions by hot-filament CVD

  • C. J. Oliphant
  • C. J. ArendseEmail author
  • G. F. MalgasEmail author
  • D. E. Motaung
  • T. F. G. Muller
  • S. Halindintwali
  • B. A. Julies
  • D. Knoesen
Article

Abstract

We report on the poisoning of tungsten filaments during the hot-filament chemical vapour deposition process at typical carbon nanotube (CNT) deposition conditions and filament temperatures ranging from 1400 to 2000 °C. The morphological and structural changes of the filaments were investigated using scanning electron microscopy and X-ray diffraction, respectively. Our results conclusively show that the W-filament is not stable during the carburization process and that both mono- and ditungsten-carbides form within the first 5 min. Cracks and graphitic microspheres form on the carbide layer during the first 15 min at the temperatures ≥1600 °C. The microspheres subsequently coalesce to form a graphite layer, encapsulating a fully carburized filament at the temperature of 2000 °C after 60 min, which inhibits the catalytic activity of the filament to produce atomic hydrogen. The structural changes of the filament also induce variations in its temperature, illustrating the instability of the filament during the deposition of CNTs.

Keywords

Carburization Filament Temperature Silicon Thin Film Deposition Pressure Carbon Microsphere 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The authors acknowledge the financial support of the Department of Science and Technology, the National Research Foundation and the Council for Scientific and Industrial Research (Project No. HGERA2S) of South Africa. The authors are especially thankful to Mr. Adrian Josephs (Microscopy Unit, University of the Western Cape) for his assistance with the SEM measurements and sample preparation.

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  • C. J. Oliphant
    • 1
    • 2
  • C. J. Arendse
    • 1
    • 2
    Email author
  • G. F. Malgas
    • 2
    Email author
  • D. E. Motaung
    • 1
    • 2
  • T. F. G. Muller
    • 1
  • S. Halindintwali
    • 1
  • B. A. Julies
    • 1
  • D. Knoesen
    • 1
  1. 1.Department of PhysicsUniversity of the Western CapeBellvilleSouth Africa
  2. 2.National Centre for Nano-Structured MaterialsCSIR Materials Science and ManufacturingPretoriaSouth Africa

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