A model system for the optimization of lamination parameters of PTFE-based dielectrics and metal surfaces
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Abstract
In microelectronic packaging, organic dielectric materials continue to displace ceramic materials because of cost, reduced weight, and performance advantages. Because thermosetting dielectric composites have long found widespread use in printed wiring board (PWB) fabrication, they have been the components of choice for many organic chip carriers. Conversely, thermoplastic dielectrics, such as fluoropolymer (FP), and in particular poly(tetrafluoroethylene)-based dielectric composites (PTFE composites) have seldom found use in multilayer wiring packages in spite of their attractive electrical properties due to their processing challenges. In this paper, we report the use of a model system comprising pure PTFE film and Cr-coated copper surfaces to optimize the bonding process through lamination conditions for a fluoropolymer composite and chromium-coated copper surfaces and to study both the interface mechanics and its chemistry as a function of processing parameters. The significant finding of the investigation was the linkage between the macroscopic mechanical properties of the interface and the observable chemical alteration of the same under some lamination conditions. The relationship of the interface properties and the processing conditions extend a conceptual framework for the thermodynamics of the metal-polymer interface and the reliability of these electronic packages in their practical designs.
Keywords
Lamination PTFE Peel Test Peel Strength Lamination ConditionNotes
Acknowledgements
The assistance of S. Hurban on SEM imaging and D. VanHart on sample preparation for stepped XPS analysis is greatly appreciated. Valuable discussions with G.O. Dearing and F.D. Egitto are also acknowledged.
References
- 1.Alcoe DJ, Jimarez MA, Jones GW, Kindl TE, Kresge JS, Libous JP, Stutzman RJ (2000) IBM MicroNews 6:7Google Scholar
- 2.Alcoe DJ, Blackwell KJ (2000) Laine ER Advanced Packaging. June/July:39Google Scholar
- 3.Park JM, Matienzo LJ, Spencer DF (1991) J Adhesion Sci Technol 5:153CrossRefGoogle Scholar
- 4.Matienzo LJ, Unertl WN (1995) In: Ghosh MK, Mittal KL (eds) Polyimides: fundamentals and applications, Marcel Dekker, New York, p 672Google Scholar
- 5.Egitto FD, Matienzo LJ (1990) Polym Degrad Stab 30:293CrossRefGoogle Scholar
- 6.Jimarez LJ, Matienzo LJ, Metha AA (1993) ASME J Electron Packag 115:256CrossRefGoogle Scholar
- 7.Egitto FD, Matienzo LJ (1994) IBM J Res Dev 38:423CrossRefGoogle Scholar
- 8.Buchwalter S, Brofman P, Feger C, Gaynes MA, Lee K-W, Matienzo LJ, Questad D (2005) IBM J Res Dev 49:663CrossRefGoogle Scholar
- 9.Leverett GF (1975) US Patent 3,929,721Google Scholar
- 10.Kawachi S, Yamamoto K, Kai S (1984) US Patent 4,440,879Google Scholar
- 11.Matienzo LJ, Shah TK (1986) Surf Interface Anal 8:53CrossRefGoogle Scholar
- 12.Matienzo LJ, Zimmermann JA, Egitto FD (1994) J Vac Sci Technol A12:2662CrossRefGoogle Scholar
- 13.Homan DC, Kureishy NZ, Unertl WN (1994) In: American physical society meeting: abstract R 28 10. Pittsburgh, PA, USA, March 21–25Google Scholar
- 14.Beamson G, Briggs D (1982) In: High resolution XPS of organic polymers: the scienta ESCA300 database. John Wiley & Sons, Chichester, UK, p 230Google Scholar
- 15.Cumpson PJ (2001) Surf Interface Anal 31:23CrossRefGoogle Scholar
- 16.Baker BB, Kasprzak DJ (1994) Poly Degrad Stab 42:181CrossRefGoogle Scholar
- 17.Zapp JA Jr, Limperos G, Brinkert KC (1955) In: Proceedings of the american industrial hygiene association annual meeting. Cincinnati, OH, April 26Google Scholar
- 18.Koptelov AA, Karyazov SV, Shlenskii OF (2004) Vysokomol Sodein Ser A Ser B 46:1093Google Scholar
- 19.Wlochowicz A, Scigala R (1989) Brit Polym J 21:205CrossRefGoogle Scholar
- 20.Cadman P, Gossedge GM (1979) J Mater Sci 14:2672CrossRefGoogle Scholar
- 21.Adamczyk B, Boeses O, Weiher N, Schroeder SLM, Kemnitz E (2000) J Fluorine Chem 101:239CrossRefGoogle Scholar
- 22.Hidaka A, Yamashita S, Kitano M, Teramoto A, Shirai Y, Ohmi T (2004) In: 206th meeting electrochemical society. Honolulu, HI, USA, 3–8 October, The Electrochemical Society, Inc., abstract 945 in CD-ROM versionGoogle Scholar
- 23.Tsvetnikov AK, Ziatdinov AM, Nazarenko TYu, Nikolenko YuM (1996) Russian J Inorg Chem 41:721Google Scholar
- 24.Matienzo LJ, Shaffer DK, Moshier WC, Davis GD (1986) J Mater Sci 21:1601CrossRefGoogle Scholar
- 25.Korleski JE (1998) US Patent 5,753,358Google Scholar
- 26.Petrarch Catalog 2000:https://doi.org/www.unitedchem.com/silicones.cfm, July 18 (2005)