Journal of Materials Science

, Volume 43, Issue 4, pp 1444–1450 | Cite as

Effect of grain size on the primary and secondary creep behavior of Sn–3 wt.% Bi alloy

  • Alaa Farag Abd El-RehimEmail author


The effect of grain size as well as creep temperature on the primary and secondary creep parameters of Sn–3 wt.% Bi alloy has been studied. It was found that the creep parameters α, β, and έs were decreased with increasing grain size. This was explained in view of the dislocation interaction with the defects and different inclusions in the matrix. For both the primary and secondary creep, the activation energies estimated indicate that the rate-controlling mechanism is the grain boundary-sliding mechanism.


Creep Curve Primary Creep Secondary Creep Creep Stage Creep Temperature 


  1. 1.
    Gao KF, Takemoto T, Nishikawa H (2006) Mater Sci Eng A 420:39CrossRefGoogle Scholar
  2. 2.
    Zeng K, Tu KN (2002) Mater Sci Eng Rep 38:55CrossRefGoogle Scholar
  3. 3.
    Shin SW, Yu J (2003) Jpn J Appl Phys 42:1368CrossRefGoogle Scholar
  4. 4.
    Song HG, Morris JW, Hua F (2002) Mater Trans A 43:1847CrossRefGoogle Scholar
  5. 5.
    Hua F, Mei Z, Glazer J (1998) Proceedings 48th electronics components and technology conference, May 25–28, Seattle, pp 277–283Google Scholar
  6. 6.
    Mei Z, Morris JW (1992) J Electron Mater 21:599CrossRefGoogle Scholar
  7. 7.
    Fawzy A, Nada RH (2006) Physica B 371:5CrossRefGoogle Scholar
  8. 8.
    Van Swygenhoven H, Spaczer M (1999) Phys Rev B 60:22CrossRefGoogle Scholar
  9. 9.
    Saad G, Graiss G, Fawzy A, Kenawy MA (1991) Ind J Pure Appl Phys 29:344Google Scholar
  10. 10.
    Abd El-Rehim AF (2007) J Alloys Compd 440:127CrossRefGoogle Scholar
  11. 11.
    Saad G, Abd El-Salam F, Mostafa MT (1984) Surf Technol 22:73CrossRefGoogle Scholar
  12. 12.
    Kenawy MA, Saad G, Mostafa MT (1983) Solid State Commun 46:763CrossRefGoogle Scholar
  13. 13.
    Alden TH (1967) Acta Metall 15:469CrossRefGoogle Scholar
  14. 14.
    Pattanaike S, Raman V (1991) IBM conference: material development in microelectronic packaging, performance and reliability. Montreel, QuebecGoogle Scholar
  15. 15.
    Miltin D, Raedu CH, Messlar RW (1999) J Metall Mater Trans A 30:115CrossRefGoogle Scholar
  16. 16.
    Al-Ganainy GS, Nagy MR, Khalifa BA, Afify R (1996) Phys Status Solidi A 158:463CrossRefGoogle Scholar
  17. 17.
    Al-Ganainy GS, Nagy MR, Khalifa BA, Afify R (2002) Egypt J Sol 25:1Google Scholar
  18. 18.
    Van Geertruyden WH, Misiolek WZ, Wang PT (2006) Mater Sci Eng A 419:105CrossRefGoogle Scholar
  19. 19.
    Nabarro FRN, de Villiers HL (1995) The Physics of creep. Taylor and Francis, LondonGoogle Scholar
  20. 20.
    Abd El-Rehim AF (2007) Mater Sci Technol 23:620CrossRefGoogle Scholar
  21. 21.
    Wilshire B, Evans RW (1985) Creep behaviour of crystalline solids. Pineridge press Ltd., Swansea, p 34Google Scholar
  22. 22.
    Mahmoud MA, Abd El-Rehim AF, Abd El-Khalek AM, Ashry AH, Graiss G (2005) Cryst Res Technol 40:665CrossRefGoogle Scholar
  23. 23.
    Kenawy MA, Sakr MS, Sakr EM, Zayed HA, Mourad NO (1990) Phys Stat Solidi A 121:467CrossRefGoogle Scholar
  24. 24.
    Youssef SB, Fawzy A, Sobhy M, Saad G (1995) Cryst Res Technol 30:7CrossRefGoogle Scholar
  25. 25.
    Kassner ME (1993) Mater Sci Eng A 166:81CrossRefGoogle Scholar
  26. 26.
    Al-Ganainy GS, Mostafa MT (2000) Egypt J Sol 23:333Google Scholar
  27. 27.
    Mukherjee AK (2002) Mater Sci Eng A 322:1CrossRefGoogle Scholar
  28. 28.
    Mukherjee AK, Bird JE, Dorn JE (1969) Trans Am Soc Metals 62:155Google Scholar
  29. 29.
    Yamane T, Genma N, Takahashi T (1984) J Mater Sci 19:263. doi CrossRefGoogle Scholar
  30. 30.
    Schneibel J, Hazzledine P (1983) J Mater Sci 18:562. doi
  31. 31.
    Mahamed FA, Langdon TG (1975) Phil Mag A 32:697CrossRefGoogle Scholar
  32. 32.
    Wadsworth J, Ruano OA, Sherby OD (2002) Metall Mater Trans A 33:219CrossRefGoogle Scholar
  33. 33.
    Abd El-Salam F, Abd El-khalekh AM, Nada RH (2000) Eur Phys J AP 12:159CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  1. 1.Physics Department, Faculty of EducationAin Shams UniversityRoxy, CairoEgypt

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