In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85
(AgSbTe2)15(GeTe)85 (TAGS-85) is a p-type semiconductor characterized by a maximum dimensionless thermoelectric figure of merit of 1.4–1.7 at elevated temperature. In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using TEM. At room temperature, pervasive twinning was observed throughout the specimen. Upon heating to above 120 °C, some of the twins dissolved and new point defects began to nucleate. The mechanisms responsible for formation of high temperature defects are discussed.
KeywordsPbTe Seebeck Coefficient GeTe Lattice Thermal Conductivity Sb2Te3
The Ames Laboratory is operated for the U. S. Department of Energy by Iowa State University under contract W-7405-ENG-82. This project was supported by the Office of Naval Research, contract no. N00014-05-IP-20065, monitored by Dr. Mihal Gross.
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