Advertisement

Journal of Materials Science

, Volume 42, Issue 14, pp 5875–5879 | Cite as

Dielectric behavior of Cu–GeO2 cermet thin films

  • Irine Banu LucyEmail author
Article

Abstract

Capacitance and dielectric loss measurements were carried out using an Al/Cu–GeO2/Al sandwich structure for 0 to 10 vol% Cu films, 120–400 nm thick, deposited at 0.4–1.5 nm/s in the frequency and temperature range 1–10Hz and 90–573 K, respectively. The variation of capacitance and dielectric loss with frequency and temperature follows the Goswami and Goswami model. Capacitance decreases slowly with increasing thickness and also varies with the change in deposition rate of the cermet film.

Keywords

Deposition Rate Loss Tangent GeO2 Sandwich Structure CoPc 

Notes

Acknowledgements

I am grateful to Dr. John Beynon of Brunel University, UK for his enthusiastic guidance throughout this work and to Prof. C. A. Hogarth of the same University for many useful discussions.

References

  1. 1.
    Lucy IB (2004) J Mat Sci 39:3163CrossRefGoogle Scholar
  2. 2.
    Zaidi SZA, Beynon J, Steele CB (1997) J Mat Sci 32(15):3921CrossRefGoogle Scholar
  3. 3.
    Hosseini AA, Hogarth CA, Beynon J (1994) J Mat Sci Lett 13:1144CrossRefGoogle Scholar
  4. 4.
    Steele CB, Beynon J, Hogarth CA, (1992) Thin Solid Films 213:76CrossRefGoogle Scholar
  5. 5.
    Lucy IB, (1999) Ind J Pure Appl Phy 37:836Google Scholar
  6. 6.
    Rahman MH, Al Saie AM, Beynon J (2000) J Mat Sci 35(23):5899CrossRefGoogle Scholar
  7. 7.
    Nava F, Tien T, Tu KN (1984) J Appl Phys 33(1):74Google Scholar
  8. 8.
    Ohring M, (1992) The materials science of thin films. Academic Press Inc., New York, p 508Google Scholar
  9. 9.
    Chopra KL, Das SR (1983) Thin film solar cells. Plenum Press and PublicationsGoogle Scholar
  10. 10.
    Goswami A, Verma RR (1975) Thin Solid Films 28:157CrossRefGoogle Scholar
  11. 11.
    Dharmadhikari VS (1983) Int J Electronics 54(6):787CrossRefGoogle Scholar
  12. 12.
    Rahman ASMS, Islam MH, Hogarth CA (1987) Int J Electronics 62(5):685CrossRefGoogle Scholar
  13. 13.
    Gould RD, Hassan AK (1993) Thin Solid Films 223:334CrossRefGoogle Scholar
  14. 14.
    Shihub SI, Gould RD (1995) Thin Solid Films 254:187CrossRefGoogle Scholar
  15. 15.
    Rahman MH (1995) PhD thesis, Dept. of Physics, Brunel University, Uxbridge, Middlesex, UKGoogle Scholar
  16. 16.
    Harrop PJ (1972) Dielectrics Butterworth & Co Publishers Ltd., London, Uk, p 4Google Scholar
  17. 17.
    Goswami A, Goswami AP (1973) Thin Solid Films 16:185Google Scholar
  18. 18.
    Lucy IB (2000) J Mat Sci 35:4567CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  1. 1.Department of PhysicsUniversity of RajshahiRajshahiBangladesh

Personalised recommendations