Low temperature degradation of zirconia under a high strength electric field
Since the fabrication of tetragonal zirconia ceramics was first reported by Reith et al. , yttria-stabilized zirconia polycrystal materials (Y-TZP) have always held great promise as high strength, moderate toughness engineering ceramics. However, the obvious loss of strength and toughness and instability of Y-TZP when exposed to low temperature (100–400 °C) environments limits its wide application. This is called low temperature degradation (LTD) phenomenon of Y-TZP [2, 3, 4, 5, 6, 7, 8, 9, 10]. All preventive methods can be grouped as either “bulk”, or “surface” methods. Recently, more and more “surface” methods with different cation-stabilizers were developed due to its advantages in effective preventing LTD and maintaining its mechanical properties at the same time [3, 4, 5, 6]. However, not too much attention has been paid to anion stabilizers. One possible reason is that the role of anion stabilizers has not been fully understood. However, ZrO2can be stabilized equally...
KeywordsOxygen Vacancy Applied Electric Field Vacancy Concentration Monoclinic Phase Anode Side
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