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Journal of Materials Science

, Volume 41, Issue 14, pp 4382–4388 | Cite as

Structure determinations of double-wall carbon nanotubes grown by catalytic chemical vapor deposition

  • M. Gao
  • J. M. ZuoEmail author
  • R. Zhang
  • L. A. Nagahara
Article

Abstract

We report an application of nanoarea electron diffraction for structure determination of double-wall carbon nanotubes (DWNT) grown by catalytic chemical vapor deposition. The structures of 30 tubes were determined from experimental diffraction patterns. Among these tubes, the inner and outer wall structure of 18 tubes was precisely determined by comparison with kinematic electron diffraction simulations. For the structure of the DWNTs, our experiment revealed a mixture of semiconducting-metallic (S-M), S-S and M-M tubes. The spacing between the two walls ranges from 0.335 nm to 0.384 nm. Most DWNTs are incommensurate and chiral.

Keywords

Graphene Sheet Outer Wall Outer Tube Chiral Angle Wall Spacing 

Notes

Acknowledgements

Work on electron microscopy characterization is supported by DOE DEFG02-01ER45923 and DEFG02-91ER45439 and uses the TEM facility of Center for Microanalysis of Materials at FS-MRL. M.G. thanks Dr. M. Kociak for discussions.

References

  1. 1.
    Theory predicts for a metallic tube if (n-m) = 3l (l: an integer) or a semiconducting tube for n-m ≠ 3l; see Mintmire JW, Dunlap BI, White CT (1992) Phys Rev Lett 68:631 and Saito R, Fujita M, Dresselhaus G, Dresselhaus MS (1992) Appl Phys Lett 60: 2204Google Scholar
  2. 2.
    Saito R, Dresselhaus G, Dresselhaus MS (1998) Physical properties of carbon nanotubes. Imperial College Press, LondonGoogle Scholar
  3. 3.
    Uryu S (2004) Phys Rev B 69:075402CrossRefGoogle Scholar
  4. 4.
    Cumings J, Zettl A (2000) Science 289:602CrossRefGoogle Scholar
  5. 5.
    Saito R, Matsuo R, Kimura T, Dresselhaus G, Dresselhaus MS (2001) Chem Phys. Lett 348:187CrossRefGoogle Scholar
  6. 6.
    Jorio A, Saito R, Hafner JH, Lieber CM, Hunter M, Mcclure T, Dresselhaus G, Dresselhaus MS (2001) Phys Rev Lett 86:1118; Bachilo SM, Strano MS, Kittrell C, Hauge RH, Smalley RE, Weisman RB (2002) Science 298:2361Google Scholar
  7. 7.
    Gao M, Zuo JM, Twesten RD, Petrov I, Nagahara LA, Zhang R (2003) Appl Phys Lett 82:2703CrossRefGoogle Scholar
  8. 8.
    Qin L-C, Iijima S, Kataura H, Maniwa Y, Suzuki S, Achiba Y (1997) Chem Phys Lett 268:101CrossRefGoogle Scholar
  9. 9.
    Kociak M, Hirahara K, Suenaga K, Iijima S (2003) Euro Phys J B 32:457CrossRefGoogle Scholar
  10. 10.
    Zuo JM, Vartanyants I, Gao M, Zhang R, Nagahara LA (2003) Science 300:1419CrossRefGoogle Scholar
  11. 11.
    Dresselhaus MS, Dai HJ (2004) Mater Res Soc Bull 29:237CrossRefGoogle Scholar
  12. 12.
    Liu Z, Zhang Q, Qin LC (2005) Appl Phys Lett 86:191903CrossRefGoogle Scholar
  13. 13.
    Cassell AM, Raymakers JA, Kong J, Dai HJ (1999) Phys Chem B 103:6484CrossRefGoogle Scholar
  14. 14.
    Zhang R, Tsui RK, Tresek J, Rawlett AM, Amlani I, Hopson T, Fejes P (2003) J Phys Chem B 107:3137CrossRefGoogle Scholar
  15. 15.
    Zuo JM, Gao M, Tao J, Li BQ, Twesten R, Petrov I (2004) Microsc Res Techniq 64:347CrossRefGoogle Scholar
  16. 16.
    Qin LC (2001) In: Zhang XF, Zhang Z (eds) Progress in transmission electron microscopy, vol 2. Springer-Verlag, BerlinGoogle Scholar
  17. 17.
    Lambin P, Lucas AA (1997) Phys Rev B 56:3571CrossRefGoogle Scholar
  18. 18.
    Amelinckx S, Lucas A, Lambin P (1999) Rep Prog Phys 62:1471CrossRefGoogle Scholar
  19. 19.
    The experimentally determined structure is the best model of ideal cylindrical tubes that fits the experimental diffraction patternGoogle Scholar
  20. 20.
    We selected 30 DWNTs randomly. Among these, 12 DWNTs are slightly curved, the diffraction patterns of these tubes were not sufficiently clear to determine the chiral vectors unambiguously. For these tubes, the mean diameter and chiral angles were measured at resolutions of 3% and 0.5° respectivelyGoogle Scholar
  21. 21.
    Thess A, Lee R, Nikolaev P, Dai H, Petit P, Robert J, Xu C, Lee YH, Kim SG, Rinzler AG, Colbert DT, Scuseria GE, Tomanek D, Fischer JE, Smalley RE (1996) Science 273:483CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2006

Authors and Affiliations

  • M. Gao
    • 1
    • 3
  • J. M. Zuo
    • 1
    Email author
  • R. Zhang
    • 2
  • L. A. Nagahara
    • 2
  1. 1.Department of Materials Science and Engineering and Materials Research LaboratoryUniversity of Illinois at UrbanaChampaignUSA
  2. 2.Physical Sciences Research LaboratoriesMotorola LabsTempeUSA
  3. 3.Department of Electrical and Computer EngineeringOhio State UniversityColumbusUSA

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