Quantitative EFTEM measurement of the composition of embedded particles
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The optimisation of parameters is investigated for the compositional analysis of nanometre-sized particles embedded in a matrix by energy-filtered transmission electron microscopy. The specific example of Cu-rich particles in a Fe matrix is used both to model and to explore the experimental limits of detection and characterisation. Modelling of alternative procedures for background extrapolation as a function of the number of pre-edge windows confirmed that greater accuracy in a fixed analysis time is achieved by using more than two pre-edge windows. Further modelling investigated the effects of noise, drift and instrumental blurring of images on the accuracy of particle size and composition measurements. Correction factors were generated for ranges of these artefact amplitudes. The corrections were then applied to experimental data and shown to be both realistic and effective. Determination of particle radius below 1 nm was demonstrated.
KeywordsTotal Acquisition Time Data Acquisition Time Average Pixel Intensity Ionisation Edge Drift Amplitude
We thank the EPSRC, Rolls Royce and the Institute of Nuclear Safety System (INSS), Japan, for support for this work. JMT was further supported by the Royal Academy of Engineering, BNFL and INSS.
- 3.Lucas GE, Odette GR, Maiti R, Sheckherd JW (1987) 13th International Symposium on Influence of Radiation on Materials Properties, p 379Google Scholar
- 9.Watanabe M, Williams D (2005) Microsc Microanal 11:1362Google Scholar
- 11.Lozano-Perez S, Sha G, Titchmarsh JM, Jenkins ML, Hirosawa S, Cerezo A, Smith GDW (2006) J. Mater. Sci. in press Google Scholar
- 15.Othen PJ (1992) Thesis, University of OxfordGoogle Scholar
- 17.Egerton RF (1986) Electron energy-loss spectroscopy in the electron microscope. Plenum, New YorkGoogle Scholar
- 18.Berger A, Kohl H (1993) Optik 92:175Google Scholar
- 26.Hofer F, Grogger W, Kothleitner G, Warbichler P (1999) Inst Phys Conf Ser EMAG 1999 161:169Google Scholar
- 34.Mor JJ (1977) In: Watson GA (ed) Lecture Notes in Mathematics, Springer-Verlag, Berlin, p 105Google Scholar
- 35.Grogger W, Varela M, Ristau R, Schaffer B, Hofer F, Krishnan KM (2004) J Electron Spectrosc Related Phenom 143:141Google Scholar
- 36.Unser M, Ellis JR, Pun T, Eden M (1987) J Microsc 145:245Google Scholar
- 38.Rose A (1970) Image Technol 12:13Google Scholar