Journal of Electronic Testing

, Volume 26, Issue 1, pp 73–86

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

Article

Abstract

A traditional specification-based core-level test method is no longer attractive in testing deeply embedded analog and mixed-signal circuits due to limited accessibility and resource issues. In order to overcome such difficulties, loopback testing has been considered as a promising solution when circuits include data conversion units; however its widespread adoption has been hindered due to fault masking, which may cause serious yield loss and test escape. The combination of seriously degraded components in a signal path and overqualified components in another signal path, may result in the overall performance of the loopback path being completely fault-free. This paper presents an efficient loopback test methodology which provides test accuracy equivalent to a traditional specification-based test. In our approach, a traditional loopback scheme is re-configured with an analog filter and an adder implemented on a Device Interface Board (DIB), and a multiple tone input is applied to the DUTs. The outcome of the proposed test is a set of performance parameters, allowing the evaluation of DUTs with respect to its specification, and efficient guidance of a self-repair mechanism. The mathematical analysis for the fault masking problem, based on linearity and noise parameters, is provided. In addition, various design parameters which may impact the accuracy of the proposed method are investigated. Both simulation and hardware measurements are presented to validate the proposed technique.

Keywords

Mixed-signal SOC testing Loopback testing Fault masking Specification 

References

  1. 1.
    Analog Devices (2009) Data sheets for broadband modem mixed-signal front end. www.analog.com
  2. 2.
    Arabi K, Kaminska B (1997) Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans Comput-Aided Des 16(7):745–753CrossRefGoogle Scholar
  3. 3.
    Bhattacharya S, Chatterjee A (2004) A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits. In: Proc IEEE Asian test symposium, pp 68–73Google Scholar
  4. 4.
    Burns M, Roberts GW (2001) An introduction to mixed-signal IC test and measurement. Oxford University Press, New YorkGoogle Scholar
  5. 5.
    Friedman JH (1991) Multivariate adaptive regression splines. Ann Stat 19(1):1–141MATHCrossRefGoogle Scholar
  6. 6.
    Goyal S, Chatterjee A, Purtell M (2007) A low-cost test methodology for dynamic specification testing of high-speed data converters. J Electron Test 23:95–106CrossRefGoogle Scholar
  7. 7.
    Gray PR, Hurst PJ, Lewis SH, Meyer RG (2001) Analysis and design of analog integrated circuits. Wiley, New YorkGoogle Scholar
  8. 8.
    Halder A, Bhattacharya S, Chatterjee A (2003) Automatic multitone alternate test generation for RF circuits using behavioral models. In: Proc IEEE international test conference, pp 665–673Google Scholar
  9. 9.
    Kim B, Fu Z, Abraham JA (2007) Transformer-coupled loopback test for differential mixed-signal specifications. In: Proc IEEE VLSI test symposium, pp 291–296Google Scholar
  10. 10.
    Mendez-Rivera MG, Valdes-Garcia A, Silva-Martinez J, Sanchez-Sinencio E (2005) An on-chip spectrum analyzer for analog built-in testing. J Electron Test 21:205–219CrossRefGoogle Scholar
  11. 11.
    Nagi N, Chatterjee A, Yoon H, Abraham JA (1999) Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans Comput-Aided Des 17(6):540–546CrossRefGoogle Scholar
  12. 12.
    Ozev S, Orailoglu A (2001) System-level test synthesis for mixed-signal designs. IEEE Trans Circuits Syst II 48(6):588–599CrossRefGoogle Scholar
  13. 13.
    Park J, Shin H, Abraham JA (2008) Parallel loopback test of mixed-signal circuits. In: Proc IEEE VLSI test symposium, pp 309–316 (2008)Google Scholar
  14. 14.
    Raghunathan A, Chun J, Abraham JA (2004) Quasi-oscillation based test for improved prediction of analog performance parameters. In: Proc IEEE international test conference, pp 252–261Google Scholar
  15. 15.
    Razavi B (2001) Design of analog CMOS integrated circuits. McGraw Hill, New YorkGoogle Scholar
  16. 16.
    Shin H, Kim B, Abraham JA (2006) Spectral prediction for specification-based loopback test of embedded mixed-signal circuits. In: Proc IEEE VLSI test symposium, pp 412–417Google Scholar
  17. 17.
    Sunter SK, Nagi N (1997) A simplified polynomial-fitting algorithm for DAC and ADC BIST. In: Proc IEEE international test conference, pp 389–395Google Scholar
  18. 18.
    Toner M, Roberts G (1996) A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta ADC. IEEE Trans Circuits Syst II 43(8):608–613CrossRefGoogle Scholar
  19. 19.
    Yu HS, Abraham JA, Hwang S, Roh J (2003) Efficient loop-back testing of on-chip ADCs and DACs. In: Proc IEEE Asia and South Pacific design automation conference, pp 651–656Google Scholar
  20. 20.
    Yu HS, Shin H, Abraham JA (2004) Performance characterization of mixed-signal circuits using a ternary signal representation. In: Proc IEEE international test conference, pp 1389–1397Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  • Hongjoong Shin
    • 1
  • Joonsung Park
    • 1
  • Jacob A. Abraham
    • 1
  1. 1.The University of Texas at AustinAustinUSA

Personalised recommendations