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Journal of Computational Electronics

, Volume 3, Issue 3–4, pp 305–309 | Cite as

A Self-Consistent Event Biasing Scheme for Statistical Enhancement

  • M. NedjalkovEmail author
  • S. Ahmed
  • D. Vasileska
Article

Abstract

The event biasing approach for statistical enhancement is generalized for self-consistent device simulations, posed by mixed boundary and initial conditions transport problems. It is shown that the weight of the particles, as obtained by biasing of the Boltzmann equation, survives between the successive steps of solving the Poisson equation. Particular biasing techniques are applied to the simulation of a 15 nm MOSFET and the convergence of the terminal and channel currents is analyzed.

Keywords

Monte Carlo statistical enhancement event biasing 

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Copyright information

© Springer Science + Business Media, Inc. 2004

Authors and Affiliations

  1. 1.Department of Electrical EngineeringArizona State UniversityTempe, AZ

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