Journal of Applied Spectroscopy

, Volume 76, Issue 4, pp 523–527 | Cite as

X-ray photoelectron spectroscopy analysis of electronic states in the oxide layer on an ultradisperse copper surface

Article

X-ray photoelectron spectroscopy (XPS) is used to study the electronic states of copper oxide covering a thin (2.0 ± 0.5 nm) layer of ultradisperse copper. A reduction in the thickness of the CuO layer is found to cause extremal behavior in the XPS spectrum parameters as opposed to their monontonic variations for CuO nanoparticles. This behavior is explained by the competition of two factors which affect the system under study: the dimensions of the substrate material and the electrostatic field in it.

Key words

X-ray photoelectron spectroscopy cupric oxide thin films dimensional effects 

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References

  1. 1.
    K. Okada and A. Kotani, J. Elect. Spec. and Rel. Phen., 78, 53–56 (1996).CrossRefGoogle Scholar
  2. 2.
    K. Okada and A. Kotani, J. Elect. Spec. and Rel. Phen., 86, 119–126 (1997).CrossRefGoogle Scholar
  3. 3.
    K. Okada and A. Kotani, J. Elect. Spec. and Rel. Phen., 88–91, 255–260 (1998).CrossRefGoogle Scholar
  4. 4.
    K. Borgohain, J. B. Singh, M. V. Rama Rao, and T. Shripathi, Phys. Rev. B, 61, 11093–11096 (2000)CrossRefADSGoogle Scholar
  5. 5.
    A. P. Shpak, I. V. Plyuto, V. B. Zabolotnyi, and A. N. Senkevich, Metallofiz. Noveishie Tekhnol., 25, 1417–1429 (2003).Google Scholar
  6. 6.
    S. Y. Lee, N. Mettlach, N. Nguyen, Y. M. Sun, and J. M. White, Appl. Surface Sci., 206, 102–109 (2003).CrossRefADSGoogle Scholar

Copyright information

© Springer Science+Business Media, Inc. 2009

Authors and Affiliations

  1. 1.Institute of MetallurgyUrals Branch of the Russian Academy of SciencesEkaterinburgRussia
  2. 2.Institute of Solid State ChemistryUrals Branch of the Russian Academy of SciencesEkaterinburgRussia

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