Error from Delay Drift in Terahertz Attenuated Total Reflection Spectroscopy

  • A. Soltani
  • T. Probst
  • S. F. Busch
  • M. Schwerdtfeger
  • E. Castro-Camus
  • M. Koch
Article

Abstract

In this article we discuss the influence of temporal stability on the value obtained for dielectric properties of materials measured by terahertz time-domain spectroscopy with particular emphasis on attenuated total reflection. The stability of three different terahertz attenuated total reflection spectroscopy systems is carefully characterized. The formalism for the complex refractive index extraction is presented and the effect of delay errors is calculated numerically. We found that good thermal stability of the terahertz system helps to minimize delay fluctuations and therefore the uncertainty of the resulting complex refractive index.

Keywords

Attenuated total reflection Delay shift Uncertainty Error 

Notes

Acknowledgments

We gratefully acknowledge funding by the German Federal Ministry of Economics and Technology through the project 61308462 and CONACyT through grant number 131931. Amin Soltani achnowledges funding by the German Academic Exchange Service.

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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • A. Soltani
    • 1
  • T. Probst
    • 1
  • S. F. Busch
    • 1
  • M. Schwerdtfeger
    • 1
  • E. Castro-Camus
    • 2
  • M. Koch
    • 1
  1. 1.Faculty of Physics and Material Sciences CenterPhilipps-Universität MarburgMarburgGermany
  2. 2.Centro de Investigaciones en Óptica A.C.LeónMéxico

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