Noise Analysis of Photoconductive Terahertz Detectors

Article

Abstract

The noise performance of photoconductive terahertz detectors is analyzed and the tradeoff between low-noise and high-responsivity operation of photoconductive detectors is investigated as a function of device parameters and operational settings. The analysis is conducted on two general photoconductive detector architectures, symmetrically pumped and asymmetrically pumped photoconductive detector architectures. The results indicate that the highest signal-to-noise ratios are offered by the symmetrically pumped and asymmetrically pumped detector architectures for the photoconductive detectors based on short-carrier lifetime and long-carrier lifetime semiconductors, respectively.

Keywords

Terahertz detector Photoconductive antenna 

References

  1. 1.
    S. Preu, G. H. Dohler, S. Malzer, L. J. Wang, and A. C. Gossard, J. Appl. Phys. 109, 061301 (2011).CrossRefGoogle Scholar
  2. 2.
    J. E. Bjarnason, T. L. J. Chan, A. W. M. Lee, E. R. Brown, D. C. Driscoll, M. Hanson, A. C. Gossard, and R. E. Muller, Appl. Phys. Lett. 85, 3983–3985 (2004).CrossRefGoogle Scholar
  3. 3.
    E. Peytavit, S. Lepilliet, F. Hindle, C. Coinon, T. Akalin, G. Ducournau, G. Mouret, and J.-F. Lampin, Appl. Phys. Lett. 99, 223508 (2011).CrossRefGoogle Scholar
  4. 4.
    P. C. Upadhya, W. Fan, A. Burnett, J. Cunningham, A. G. Davies, E. H. Linfield, J. Lloyd-Hughes, E. Castro-Camus, M. B. Johnston, and H. Beere, Opt. Lett. 32, 2297–2299 (2007).CrossRefGoogle Scholar
  5. 5.
    H. Roehle, R. J. B. Dietz, H. J. Hensel, J. Böttcher, H. Künzel, D. Stanze, M. Schell, and B. Sartorius, Opt. Express 18, 2296–2301 (2010).CrossRefGoogle Scholar
  6. 6.
    Z. D. Taylor, E. R. Brown, and J. E. Bjarnason, Opt Lett. 31, 1729–1731 (2006).CrossRefGoogle Scholar
  7. 7.
    S.-G. Park, K. H. Jin, M. Yi, J. C. Ye, J. Ahn, and K.-H. Jeong, ACS Nano 6, 2026–2031 (2012).CrossRefGoogle Scholar
  8. 8.
    D. H. Auston, K. P. Cheung, and P. R. Smith, Appl. Phys. Lett 45, 284–286 (1984).CrossRefGoogle Scholar
  9. 9.
    M. Beck, H. Schafer, G. Klatt, J. Demsar, S. Winnerl, M. Helm, and T. Dekorsy, Opt. Express 18, 9251–9257 (2010).CrossRefGoogle Scholar
  10. 10.
    M. Jarrahi, and T. H. Lee, Proc. Int. Microwave Symp 1 . 391–394 (2008).Google Scholar
  11. 11.
    M. Jarrahi, Photon. Technol. Lett. 21, 2019620 (2009).CrossRefGoogle Scholar
  12. 12.
    T. Hattori, K. Egawa, S. I. Ookuma, and T. Itatani, Jpn. J. Appl. Phys. 45, L422-L424 (2006).CrossRefGoogle Scholar
  13. 13.
    J. H. Kim, A. Polley, and S. E. Ralph, Opt. Lett 30, 2490–2492 (2005).CrossRefGoogle Scholar
  14. 14.
    C. W. Berry, N. Wang, M. R. Hashemi, M. Unlu, and M. Jarrahi, Nature Commun. 4, 1622, doi: 10.1038/ncomms2638 (2013).CrossRefGoogle Scholar
  15. 15.
    C. W. Berry, and M. Jarrahi, New J. Phys. 14, 105029 (2012).CrossRefGoogle Scholar
  16. 16.
    C. W. Berry, M. R. Hashemi, M. Unlu, and M. Jarrahi, J. Visualized Experiments, 2013 (in press)Google Scholar
  17. 17.
    P. R. Smith, D. H. Auston, and M. C. Nuss, IEEE J. Quantum Electron. 24, 255 (1988).CrossRefGoogle Scholar
  18. 18.
    M. van Exter, and D. Grischkowsky, IEEE Trans. Microwave Theory Tech. 38, 1684 (1990).CrossRefGoogle Scholar
  19. 19.
    Y. Cai, I. Brener, J. Lopata, J. Wynn, L. Pfeiffer, J. B. Stark, Q. Wu, X.-C. Zhang, and J. F. Federici, Appl. Phys. Lett 73, 444–446 (1998).CrossRefGoogle Scholar
  20. 20.
    F. G. Sun, G. A. Wagoner, and X.-C. Zhang, Appl. Phys. Lett.67, 1656–1658 (1995).CrossRefGoogle Scholar
  21. 21.
    J. F. O’Hara, J. M. O. Zide, A. C. Gossard, A. J. Taylor, and R. D. Averitt, Appl. Phys. Lett 88, 251119 (2006).CrossRefGoogle Scholar
  22. 22.
    M. Tani, K.-S. Lee, and X.-C. Zhang, Appl. Phys. Lett 77, 1396–1398 (2000).CrossRefGoogle Scholar
  23. 23.
    T.-A. Liu, M. Tani, M. Nakajima, M. Hangyo, and C.-L. Pan, Appl. Phys. Lett. 83, 1322–1324 (2003).CrossRefGoogle Scholar
  24. 24.
    M. Suzuki, and M. Tonouchi, Appl. Phys. Lett 86, 163504 (2005).CrossRefGoogle Scholar
  25. 25.
    T. Kataoka, K. Kajikawa, J. Kitagawa, Y. Kadoya, and Y. Takemura, Appl. Phys. Lett 97, 201110 (2010).CrossRefGoogle Scholar
  26. 26.
    T.-A. Liu, M. Tani, M. Nakajima, M. Hangyo, K. Sakai, S.-I. Nakashima, and C.-L. Pan, Opt. Express 12, 2954–2959 (2004).CrossRefGoogle Scholar
  27. 27.
    E. Castro-Camus, J. Lloyd-Hughes, M. B. Johnston, M. D. Fraser, H. H. Tan, and C. Jagadish, Appl. Phys. Lett 86, 254102 (2005).CrossRefGoogle Scholar
  28. 28.
    F. Peter, S. Winnerl, S. Nitsche, A. Dreyhaupt, H. Schneider and M. Helm, Appl. Phys. Lett 91, 40–42 (2007).Google Scholar
  29. 29.
    S. Liu, X. Shou, and A. Nahata, IEEE Trans. Terahertz Sci. Technol 1, 412–415 (2011).CrossRefGoogle Scholar
  30. 30.
    B. Heshmat, H. Pahlevaninezhad, Y. Pang, M. Masnadi-Shirazi, R. B. Lewis, T. Tiedje, R. Gordon, and T. E. Darcie, Nano Lett. 12, 6255–6259 (2012).CrossRefGoogle Scholar
  31. 31.
    N. Wang, M. R. Hashemi, and M. Jarrahi, Opt. Express (in press)Google Scholar
  32. 32.
    S. M. Duffy, S. Verghese, K. A. McIntosh, A. Jackson, A. C. Gossard, and S. Matsuura, IEEE Trans. Microwave Theory Tech. 49, 1032–1038 (2001).CrossRefGoogle Scholar
  33. 33.
    E. R. Brown, Int. J. High Speed Electronics and Systems 13, 497–545 (2003).CrossRefGoogle Scholar
  34. 34.
    E. R. Brown, F. W. Smith, and K. A. McIntosh, J. Appl. Phys. 73, 1480–1484 (1993).Google Scholar
  35. 35.
    L. Hou, W. Shi, and S. Chen, IEEE J. Selected Topics in Quantum Electronics 19, 8401305 (2013).CrossRefGoogle Scholar
  36. 36.
    S. Gregory, C. Baker, W. R. Tribe, I. V. Bradley, M. J. Evans, E. H. Linfield, A. G. Davies, and M. Missous, IEEE J. Quantum Electron. 41, 717–728 (2005).CrossRefGoogle Scholar
  37. 37.
    C. W. Berry, and M. Jarrahi, J. Infrared, Millimeter & Terahertz Waves 33, 1182–1189 (2012).CrossRefGoogle Scholar
  38. 38.
    P. Uhd Jepsen, R. H. Jacobsen, and S. R. Keiding, J. Opt. Soc. Am. B 13, 2424–2436 (1996).CrossRefGoogle Scholar
  39. 39.
    Z. Piao, M. Tani, and K. Sakai, Jpn. J. Appl. Phys 39, 96–100 (2000).CrossRefGoogle Scholar
  40. 40.
    K. Ezdi, B. Heinen, C. Jordens, N. Vieweg, N. Krumbholz, R. Wilk, M. Mikulics, and M. Koch, J. European Opt. Soc. 4, 09001 (2009).CrossRefGoogle Scholar
  41. 41.
    J. Johnson, Phys. Rev 32, 97 (1928).CrossRefGoogle Scholar
  42. 42.
    H. Nyquist, Phys. Rev 32, 110 (1928).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.Electrical Engineering and Computer Science DepartmentUniversity of MichiganAnn ArborUSA

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