Empirical Software Engineering

, Volume 13, Issue 2, pp 125–146 | Cite as

The internal consistency and precedence of key process areas in the capability maturity model for software

Article

Abstract

Evaluating the reliability of maturity level (ML) ratings is crucial for providing confidence in the results of software process assessments. This study investigates the dimensions underlying the maturity construct in the Capability Maturity Model (CMM) for Software (SW-CMM) and estimates the internal consistency of each dimension. The results suggest that SW-CMM maturity is a three-dimensional construct, with “Project Implementation” representing the ML 2 key process areas (KPAs), “Organization Implementation” representing the ML 3 KPAs, and “Quantitative Process Implementation” representing the KPAs at MLs 4 and 5. The internal consistency for each of the three dimensions as estimated by Cronbach’s alpha exceeds the recommended value of 0.9. Based on those results, this study builds and tests a theoretical model which posits that the achievement of lower ML KPAs sustains the implementation of higher ML KPAs. Results of path analysis using partial least squares (PLS) support the theoretical model and provide detailed understanding of the process improvement path. The analysis is based on 676 CMM-Based Appraisal for Internal Process Improvement (CBA IPI) assessments.

Keywords

Cronbach’s alpha Convergent and discriminant validities Dimensionality Factor analysis Internal consistency Partial least squares SW-CMM 

Notes

Acknowledgements

The authors wish to acknowledge the assessors, sponsors, and others who participated in the assessments of the SW-CMM. This work would not be possible without the information that they regularly provide to the SEI. Thanks to Mike Zuccher, Kenny Smith, and Xiaobo Zhou for their support in extracting the data on which the study is based. The authors would also like to thank Sheila Rosenthal for her expert support with our bibliography, and Lauren Heinz for helping improve the readability of the document. The authors express their thanks to our SEI colleagues, Will Hayes, Mike Konrad, Keith Kost, Steve Masters, Jim McCurley, Mark Paulk, Mike Phillips, and Dave Zubrow. Thanks also to Khaled El-Emam, Robin Hunter, and Hyung-Min Park for their valuable comments on earlier drafts. Many thanks to the anonymous referees for the valuable comments and suggestions to improve the presentation of the paper. This study was supported by a Korea University Grant (2006). This support is gratefully acknowledged.

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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  1. 1.Korea University Business SchoolSeoulSouth Korea
  2. 2.Software Engineering InstituteCarnegie Mellon UniversityPittsburghUSA

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