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Computational Mathematics and Modeling

, Volume 30, Issue 1, pp 36–47 | Cite as

Single Fault Diagnostic Tests for Inversion Faults of Circuit Elements Over Some Bases

  • I. G. LyubichEmail author
  • D. S. Romanov
Article
  • 1 Downloads

The article shows that, in a number of bases, every Boolean function can be realized by an irredundant combinational circuit that admits a single fault diagnostic test of length not greater than 4 with respect to inversion faults on the element outputs.

Keywords

combinational circuit inversion fault single fault diagnostic test Shannon function 

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References

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© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.Lomonosov Moscow State UniversityMoscowRussia

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