Estimation of trace metal elements in oral mucosa specimens by using SR-XRF, PIXE, and XAFS
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The effects of dissolved elements from metal dental restorations are a major concern in lesions of the oral mucosa, and the evaluation of accumulated metal elements, especially their distribution and chemical state, is essential for determining the precise effects of trace metals. In this study, X-ray fluorescence with synchrotron radiation (SR-XRF) and particle-induced X-ray emission (PIXE) were applied for distribution analysis of the trace metal elements contained in the oral mucosa, and the chemical states of the elements were estimated using X-ray absorption fine structure (XAFS) analysis. Appropriate combination of these analysis techniques, particularly SR-XRF and PIXE, to visualize the distributions of the elements in the oral mucosa allowed for the observation and evaluation of accumulated metal ions and debris. Importantly, the analyses in this study could be carried out using conventional histopathological specimens without damaging the specimens. Therefore, this method would be applicable for the detection of accumulated trace metal elements in biopsy specimens from the oral mucosa.
KeywordsSynchrotron radiation X-ray fluorescence analysis Particle-induced X-ray emission analysis X-ray absorption fine structure analysis Trace elemental analysis Histopathological specimen
The SR-XRF and XAFS measurements were performed with the approval of the Photon Factory Program Advisory Committee (Proposal Nos. 2012G011, 2013P002, and 2014G017). This work was financially supported by Japan Society for the Promotion of Science KAKENHI (Grant no. 23390438 to M. Uo). T. Sugiyama is a supported by a research fellowship for young scientists from Japan Society for the Promotion of Science.
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