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Annals of Operations Research

, Volume 148, Issue 1, pp 117–132 | Cite as

A method for reconstructing label images from a few projections, as motivated by electron microscopy

  • Hstau Y. Liao
  • Gabor T. Herman
Article

Abstract

Our aim is to produce a tessellation of space into small voxels and, based on only a few tomographic projections of an object, assign to each voxel a label that indicates one of the components of interest constituting the object. Traditional methods are not reliable in applications, such as electron microscopy in which (due to the damage by radiation) only a few projections are available. We postulate a low level prior knowledge regarding the underlying distribution of label images, and then directly estimate the label image based on the prior and the projections. We use a relatively efficient approximation to a global search for the optimal estimate.

Keywords

Electron tomography Electron microscopy Gibbs distribution Few projections Global optimization Simulated annealing 

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Copyright information

© Springer Science + Business Media, LLC 2006

Authors and Affiliations

  1. 1.Institute for Mathematics and Its ApplicationsUniversity of MinnesotaMinneapolisUSA
  2. 2.Department of Computer ScienceDiscrete Imaging and Graphics Group Graduate Center, CUNYNew YorkUSA

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