Jitter characteristics of an on-chip voltage reference-locked time-to-digital converter
- 168 Downloads
The noise and jitter characteristics of an on-chip voltage reference-locked ring oscillator used in the time-to-digital converter (TDC) of the integrated receiver of a pulsed time-of-flight laser rangefinder are presented. The frequency of the ring oscillator, 683 MHz, was locked to the on-chip voltage reference by means of a frequency-to-voltage converter, resulting in better than 90 ppm/°C stability. The noise and jitter transfer characteristics of the loop were derived, and simulations were performed to see the effects of different noise types (white and 1/f noise) on the cumulative jitter of the locked ring oscillator. Finally, these results were verified by jitter measurements performed using an integrated time-to-digital converter (TDC) fabricated on the same die (0.18 μm CMOS process). The cumulative jitter of the on-chip reference-locked ring oscillator was less than 30 ps (sigma value) over a time range of 70 ns, which made it possible to use this oscillator as the heart of a TDC when aiming at centimetre-level precision (1 cm = 67 ps) in laser ranging.
KeywordsJitter Reference locked oscillator Time-to-digital converter Phase noise
This work was supported financially by the Finnish Funding Agency for Technology and Innovation (TEKES), the Academy of Finland and certain industrial companies, all of which are gratefully acknowledged.
- 3.Nelson, B., & Soma, M. (2004). On-chip calibration technique for delay line based BIST jitter measurement. In Proceedings of international symposium on circuits and systems (ISCAS’04), Vancouver, Canada, Vol. 1, pp. 944–947.Google Scholar
- 4.Djemouai, A., Sawan, M., & Slamani, M. (1999). New circuit techniques based on a high performance frequency-to-voltage converter. In Proceedings of IEEE international conference on electronics, circuits and systems (ICECS’99), Montreal, Canada, Vol. 1, pp. 13–16.Google Scholar
- 5.Djemouai, A., Sawan, M., & Slamani, M. (1998). High performance integrated CMOS frequency-to-voltage converter. In Proceedings of international conference on microelectronics (ICM’98), Monastir, Tunisia, pp. 63–66.Google Scholar
- 7.Nissinen, I., & Kostamovaara, J. (2004). A low voltage CMOS constant current–voltage reference circuit. In Proceedings of international symposium on circuits and systems (ISCAS’04), Vancouver, Canada, Vol. 1, pp. 381–384.Google Scholar
- 8.Nissinen, I., & Kostamovaara, J. (2008). Noise and jitter transfer characteristics of an on-chip voltage reference-locked loop. In Proceedings of 26th IEEE NORCHIP conference, Tallinn, Estonia, pp. 212–216.Google Scholar
- 9.Hajimiri, A., & Lee, T. H. (2001). The design of low noise oscillators. USA: Kluwer. 4th Printing.Google Scholar
- 12.Mota, M., et. al. (2000). A flexiple multi-channel high-resolution time-to-digital converter ASIC. In Proceedings of nuclear science symposium conference record, Lyon, France, Vol. 2, pp. 155–159.Google Scholar
- 14.Tisa, S., et al. (2003). Monolithic time-to-digital converter with 20 ps resolution. In Proceedings of European solid-state circuit conference (ESSCIRC’03), Estoril, Portugal, pp. 465–468.Google Scholar