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Tetragonal structure of thin nickel films on Cu(001)

  • P. Le Fèvre
  • H. Magnan
  • D. Chandesris
Article

Abstract:

The crystallographic structure of thin Ni films deposited on Cu(001) has been studied using Surface Extended X-ray Absorption Fine Structure (SEXAFS). Taking advantage of the linear polarization of the synchrotron radiation, we have shown that Ni adopts the Cu lattice parameter parallel to the interface. This lateral expansion induces a longitudinal compression of the unit cell, leading to a face centered tetragonal structure of the Ni films from 3 to 10 monolayers. The temperature dependence of the EXAFS oscillations has allowed to measure strain inside the Ni layers.

PACS. 68.55.-a Thin film structure and morphology - 75.70.Ak Magnetic properties of monolayers and thin films - 68.35.Ja Surface and interface dynamics and vibrations 

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Copyright information

© EDP Sciences, Springer-Verlag 1999

Authors and Affiliations

  • P. Le Fèvre
    • 1
  • H. Magnan
    • 1
  • D. Chandesris
    • 1
  1. 1.Laboratoire pour l'Utilisation du Rayonnement ÉlectromagnétiqueUniversité Paris-SudOrsay CedexFrance

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