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Electron screening in backward elastic scattering

  • F. Schümann
  • S. Zavatarelli
  • L. Gialanella
  • U. Greife
  • M. Junker
  • D. Rogalla
  • C. Rolfs
  • F. Strieder
  • H.P. Trautvetter
Short notes

Abstact:

The elastic scattering cross sections, σ (E,θ), for the systems He+Ta and He+W have been measured at θlab=165° and Elab=76.1 keV to 3.988 MeV using targets with a thickness of a few atomic layers. The results are smaller than the results given by the Rutherford scattering law, σR(E,θ), due to the effects of electron screening and can be described by σ(E,θ)/σR(E,θ)=(1+Ue/E)−1, where Ue is an atomic screening potential energy. The deduced average value, Ue=28 ± 3 keV, is consistent with the Moliére- and Lenz-Jensen-models as well as electron binding energies.

PACS:25.60.Bx Elastic scattering 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • F. Schümann
    • 1
  • S. Zavatarelli
    • 2
  • L. Gialanella
    • 1
  • U. Greife
    • 1
  • M. Junker
    • 1
  • D. Rogalla
    • 1
  • C. Rolfs
    • 1
  • F. Strieder
    • 1
  • H.P. Trautvetter
    • 1
  1. 1.Institut für Physik mit Ionenstrahlen, Ruhr-Universität, Bochum, Universitätsstr. 150, D-44780 Bochum, GermanyDE
  2. 2.Dipartimento di Fisica, Università di Genova and INFN, Via Dolecaneso, I-16146 Genova, ItalyIT

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