Optical Review

, Volume 6, Issue 3, pp 257–260 | Cite as

Application of Solid Immersion Lens to Submicron Resolution Imaging of Nano-Scale Quantum Wells

  • Motoyoshi Baba
  • Masahiro Yoshita
  • Takeaki Sasaki
  • Hidefumi Akiyama
5th International Conference on NEAR FIELD OPTICS and RELATED TECHNOLOGIES (NFO-5)

Abstract

We have discussed the resolution of submicron photoluminescence (PL) imaging using a solid immersion lens (SIL), which collects an evanescent light field. We apply the SIL microscope to measure PL image of a strip-line-patterned GaAs quantum well structure at low temperature. An improved resolution beyond diffraction limit and high collection efficiency of PL are realized.

Key words

solid immersion lens submicron resolution imaging nano-scale quantum wells near-field optics spherical aberration spatial resolution 

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Copyright information

© The Optical Society of Japan 1999

Authors and Affiliations

  • Motoyoshi Baba
    • 1
  • Masahiro Yoshita
    • 1
  • Takeaki Sasaki
    • 1
  • Hidefumi Akiyama
    • 1
  1. 1.Institute for Solid State Physics, The University of TokyoTokyoJapan

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