Observation of Resonant Photon Tunneling in Photonic Double Barrier Structures
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Reflectance and transmittance of 632.8 nm He-Ne laser light for photonic double barrier structures (consisting of a SF10 prism, SiO2 layer, Al or Al2O3 active layer, SiO2 layer and SF10 prism) were measured as a function of the angle of incidence for both the ρ- and s-polarized incidence. Sharp reflection dips and transmission peaks were observed at angles larger than the critical angle of total reflection. The appearance of the transmission peaks can be attributed to resonant photon tunneling through the photonic double barrier structures analogous to resonant electron tunneling through double potential barrier structures. Resonant tunneling is mediated by the long-range surface plasmon polariton in the case of the Al active layer and the electromagnetic guided modes in the case of the Al2O3 layer.
Key wordsresonant photon tunneling frustrated total reflection surface plasmon guided mode double barrier structure
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- 3.E. Yablonovitch: J. Opt. Soc. Am. B 10 (1993) 283.Google Scholar
- 4.R. Y. Chiao, P. G. Kwiat and A. M. Steinberg: Physica B 175 (1991) 257.Google Scholar
- 5.B. Lee and W. Lee: J. Opt. Soc. Am. B 14 (1997) 777.Google Scholar
- 6.H. Mizuta and T. Tanoue: The Physics and Applications of Resonant Tunneling Diodes (Cambridge University Press, Cambridge, 1995) Chap. 2, p. 9.Google Scholar
- 7.A. F. Turner: J. de Phys. et le Radium, Paris 11 (1950) 444.Google Scholar
- 8.A. Otto: Optik 29 (1969) 246.Google Scholar
- 11.H. Reather: Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics Vol. 111 (Springer-Verlag, Berlin, 1988) Chap. 2, p. 19.Google Scholar
- 12.F. Abeles: Ann. Phys. 3 (1948) 504.Google Scholar
- 15.D. Y. Smith, E. Shiles and M. Inokuti: Handbook of Optical Constants of Solids, ed. E. D. Palik (Academic Press, Orlando, 1985) p. 369.Google Scholar
- 17.E. L. Wolf: Principles of Electron Tunneling Spectroscopy (Oxford University Press, New York, 1985) Chap. 2, p. 27.Google Scholar