Optical Review

, Volume 17, Issue 3, pp 210–213

Quadrature phase-shifting interferometer with a polarization imaging camera

  • Tomohiro Kiire
  • Toyohiko Yatagai
  • Suezou Nakadate
  • Masato Shibuya
Regular Papers

DOI: 10.1007/s10043-010-0037-0

Cite this article as:
Kiire, T., Yatagai, T., Nakadate, S. et al. OPT REV (2010) 17: 210. doi:10.1007/s10043-010-0037-0

Abstract

We present a new high-speed phase distribution measurement, in which a polarization imaging camera is applied to a quadrature phase-shifting interferometer. The polarization imaging camera composed of a polarizer-mask on a detector array can provide simultaneously two phase-shifted data in quadrature. Two sets of two phase-shifted data in quadrature are obtained before and after a change of the interferometer such as object displacement or environmental disturbances. Phase sum and difference distributions of the interferograms between two states with arbitrary phase-shift in the interferometer are calculated with the two sets of two phase-shifted data in quadrature. This phase calculation method in the pixel displaced phase-shift method has such advantage that phase-shifted data required for the calculation of phase distributions can be obtained by only two pixels in the polarizer-mask detector array, which means no reduction of the image resolution in the other direction. The principle of this technique and experimental results are presented.

Keywords

interferometer phase shift phase calculation polarization polarizer-mask 

Copyright information

© The Optical Society of Japan 2010

Authors and Affiliations

  • Tomohiro Kiire
    • 1
  • Toyohiko Yatagai
    • 1
  • Suezou Nakadate
    • 2
  • Masato Shibuya
    • 2
  1. 1.Center for Optical Research and Education (CORE)Utsunomiya UniversityUtsunomiyaJapan
  2. 2.Department of Media and Image Technology, Faculty of EngineeringTokyo Polytechnic UniversityAtsugi, KanagawaJapan

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