Optical Review

, Volume 13, Issue 4, pp 242–248 | Cite as

The Influence of Defects on the Propagation Light within Polymeric Optical Waveguides Studied by Polarized Near-Field Scanning Optical Microscopy

  • Tadashi Mitsui
  • Kazuaki Sakoda
  • Giyuu Kido
Special Section: The 5th Asia-Pacific Conference on Near-Field Optics
Received:
Accepted:
  • 42 Downloads

Abstract

We have developed a polarization-preserving near-field scanning optical microscopy (NSOM) optical fiber probe and with it observed the influence of defects and weak stresses on a propagation light within polymeric optical waveguides. To characterize the influence, we intentionally printed an indentation in the vicinity of the waveguide and then evaluated the resulting influence using polarized guide-collection-mode NSOM images taken around the indentation. When transverse magnetic polarized light enters a waveguide, the light intensity becomes greater on the near side of the indentation than on the far side, as measured by a linearly polarized component perpendicular to the direction of light propagation. The most probable cause of this phenomenon is microdefects generated by the printing of the indentation. The polarized NSOM technique is useful in searching for small defects or stresses within integrated photonic devices.

Key words

near-field scanning optical microscopy polarization optical waveguide defect stress-strained field polymer 
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Copyright information

© The Optical Society of Japan 2006

Authors and Affiliations

  • Tadashi Mitsui
    • 1
  • Kazuaki Sakoda
    • 1
  • Giyuu Kido
    • 1
  1. 1.Nanomaterials LaboratoryNational Institute for Materials Science (NIMS)Tsukuba, IbarakiJapan

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