Electrical tree inhibition by SiO2/XLPE nanocomposites: insights from first-principles calculations
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It has been extensively observed in experiments that nanoparticle additives can efficiently inhibit the electrical tree growth of the cross-linked polyethylene (XLPE) matrix of power cables. Inspired by this, the first-principles calculations employing the density functional theory (DFT) method were performed in this study to investigate the significant role of SiO2 nanosized fillers as a voltage stabilizer for power cable insulation. Several different types of α-SiO2 fillers, including hydroxylated, reconstructed, doped or oxygen vacancy surface structures, were constructed to model the interfacial interaction for SiO2/XLPE nanocomposites. It is found that the SiO2 additives can restrict the movement of the polyethylene chain through van der Waals physical interaction. More importantly, based on the Bader charge analysis we reveal that SiO2 could effectively capture hot electrons to suppress space charge accumulation in XLPE. However, some particular modified-surface SiO2, such as incompletely hydroxylated, B-doped, and oxygen vacancy defect on the top layer, could induce the H migration reaction and consequent electrical tree growth of the XLPE chain. In contrast, the SiO2 particles that have N-doped or oxygen vacancy on the lower layer with completely hydroxylated surfaces, as well as the reconstructed surface, are predicted to be favorable additives because of their quite strong physical interaction and very weak chemical activity with XLPE. The present study is useful to understand the mechanism of the nanosized voltage stabilizer and also provide important information for further experimental investigation.
KeywordsElectrical tree inhibition SiO2 Cross-linked polyethylene Density functional theory Interfacial interaction
This work was supported by the National Natural Science Foundation of China (Grant No. 21203041), Natural Science Foundation of Heilongjiang province in China (Grant No. B2016004), the Fundamental Research Funds for the Central Universities in China (Grant No. HIT. NSRIF. 2017033), and the open project of Key Laboratory of Engineering Dielectrics and Its Application (Harbin University of Science and Technology), Ministry of Education, (Grand No. KF20151105).
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Conflicts of interest
There are no conflicts of interest to declare.
- 2.Ramachandran S, Hartlein R, Chandak P (1999) A comparative economic analysis for underground distribution cables insulated with TR-XLPE and EPR. In: IEEE/PES transmission and distribution conference, 11–16 Apr 1999, pp 112–119Google Scholar
- 4.Mizutani T, Hikita M, Umemura A, Ieda M (1989) Electrical breakdown and space charge of polyphenylene sulfide films. In: Conference on electrical insulation and dielectric phenomena, 29 Oct −01 Nov 1989, pp 315–320Google Scholar
- 5.Jarvid M, Johansson A, Englund V, Gubanski S (2012) Electrical tree inhibition by voltage stabilizers. In: IEEE conference on electrical insulation and dielectric phenomena, 14–17 Oct 2012, pp 605–608Google Scholar
- 6.Yin Y, Tu D, Du Q, Gong Z (2000) Distribution and effect of space charge on dielectric properties in modified XLPE by chlorinated polyethylene. In: 6th international conference on properties and applications of dielectric materials, 21–26 Jun 2000, pp 268–271Google Scholar
- 7.Bradwell A, Cooper R, Varlow B (1971) Conduction in polythene with strong electric fields and the effect of prestressing on the electric strength. Proc IEE 118(1):247–254Google Scholar
- 14.Yin Y, Du Q, Gong Z (2000) Influence of blending chlorinated polyethylene on the space charge effect in polyethylene. Trans China Electrotech Soc 15(2):52–57Google Scholar
- 20.Iizuka T, Tanaka T (2009) Effects of nano silica filler size on treeing breakdown lifetime of epoxy nanocomposites. In: 9th international conference on properties and applications of dielectric materials, 19–23 Jun 2009, pp 733–736Google Scholar
- 21.Tanaka T, Iizuka T, Sekiguchi Y, Murata Y (2009) Tree initiation and growth in LDPE/MgO nanocomposites and roles of nano fillers. In: Annual report conference on electrical insulation and dielectric phenomena, 18–21 Oct 2009, pp 646–649Google Scholar
- 22.Tanaka T, Bulinski A, Castellon J, Frechette M, Gubanski S, Kindersberger J, Montanari GC, Nagao M, Morshuis P, Tanaka Y, Pelissou S, Vaughan A, Ohki Y, Reed CW, Sutton S, Han SJ (2011) Dielectric properties of XLPE/SiO2 nanocomposites based on CIGRE WG D1.24 cooperative test results. IEEE Trans Dielectr Electr Insul 18(5):1482–1517CrossRefGoogle Scholar
- 25.Ding HZ, Varlow BR (2004) Effect of nano-fillers on electrical treeing in epoxy resin subjected to AC voltage. In: Annual conference on electrical insulation and dielectric phenomena (CEIDP), 17–20 Oct 2004, pp 332–335Google Scholar
- 27.Wang Y, Xiao K, Wang C, Yang L, Wang F (2016) Study on dielectric properties of TiO2/XLPE nanocomposites. In: IEEE international conference on high voltage engineering and application (ICHVE), 19–22 Sept 2016, pp 1–4Google Scholar
- 30.Hickel PE, Lafon F, Fortis F, Cambon O, Demazeau G (1997) On the development of new solvents for the high pressure crystal growth of α-quartz. Ann Chim-Sci Mat 22(8):571–576Google Scholar
- 31.Hickel PE, Lafon F, Chvansky PP, Largeteau A, Demazeau G (1997) Influence of the different physico-chemical parameters governing the crystal growth of α-quartz on the concentration of chemical defects. Ann Chim-Sci Mater 22(8):583–588Google Scholar
- 57.Bader RFW (1994) Atoms in molecules: a quantum theory. THEOCHEM J Mol Struct 360(1–3):175Google Scholar
- 61.Liu Q, Poumellec B, Blum R, Girard G (2006) Stability of electron-beam poling in N or Ge-doped H:SiO2 films. Appl Phys Lett 88(24):693Google Scholar
- 62.Weidner DJ (1980) Structure and elastic properties of quartz at pressure. Am Mineral 65(2):920–930Google Scholar