The piezoresistance of a device with polyphenylenevinylene derivative PSS-PPV film
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The mechanical and electrical characteristics of poly[1-methoxy-4-(3-propyloxy-heptaisobutyl-PSS)-2,5-phenylenevinylene] (PSS-PPV) film were studied in this work. The loading curves and Young’s modulus of PSS-PPV film were measured with nanoindentation tests. The device ITO/PSS-PPV (75 nm)/Al (100 nm) was fabricated and measured to obtain the current–voltage (I–V) and current-time (I–T) curves under different pressures ranging in 0–163 kPa. The device demonstrated high sensitivity, good stability, and nice repeatability. The piezoresistance coefficient can even reach 2.0 × 10−3 Pa−1 at 0.2 V and 111 kPa. The time and charges required to form a stable build-in electric field in the device under different pressures were analyzed using a high-frequency square-wave voltage. It is deduced that the applied pressure not only tightens the PSS-PPV film but also improves its conductance. This property makes PSS-PPV film possess prospect in pressure sensing applications, though it still suffers from partly slow recovering after considerable compression.
This work was financially supported by the National Natural Science Foundation of China under Grant 51373036 and 11134002.
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