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e & i Elektrotechnik und Informationstechnik

, Volume 129, Issue 1, pp 28–33 | Cite as

Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration

  • J. Steininger
  • S. Kuiper
  • S. Ito
  • G. Schitter
Originalarbeiten

Zusammenfassung

Für die Rasterkraftmikroskopie (AFM) ist eine schnelle und hochpräzise Führung der AFM-Positioniereinheit und Messspitze ausschlaggebend. Besonders bei hohen Scangeschwindigkeiten führt die Dynamik der AFM-Positioniereinheit zu Abbildungsartefakten, wodurch die maximale Messgeschwindigkeit und Bildqualität eingeschränkt wird. In diesem Artikel werden moderne Ansätze diskutiert, welche zu einer signifikanten Steigerung der Messgeschwindigkeiten führen.

Schlüsselwörter

Rastersondenmikroskopie Rasterkraftmikroskop Regelungstechnik Nanotechnologie Nanometrologie 

High-speed atomic force microscopy by modern control and mechatronic system integration

Summary

In atomic force microscopy (AFM) high-performance and high precision control of the scanning-system is crucial. At high imaging speeds the dynamic behaviour of the scanner may cause imaging artefacts limiting the maximum imaging rate. This contribution discusses recent improvements for faster imaging by utilizing modern mechatronic and control engineering methods.

Keywords

SPM AFM Scanning probe Control Nanotechnology Nanometrology 

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Copyright information

© Springer-Verlag 2012

Authors and Affiliations

  • J. Steininger
    • 1
  • S. Kuiper
    • 2
  • S. Ito
    • 3
  • G. Schitter
    • 3
  1. 1.Institut für Automatisierungs- und RegelungstechnikTechnische Universität WienWienAustria
  2. 2.Delft University of TechnologyDelft Center for Systems and ControlDelftNetherlands
  3. 3.Technische Universität WienInstitut für Automatisierungs- und RegelungstechnikWienAustria

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