Colloid and Polymer Science

, Volume 278, Issue 10, pp 993–999 | Cite as

Surface structure of thin film blends of polystyrene and poly(n -butyl methacrylate)

  • S. Affrossman
  • R. Jerome
  • S. A. O'Neill
  • T. Schmitt
  • M. Stamm
SHORT COMMUNICATION

Abstract

 Thin films of blends of polystyrene (PS) and poly(n-butyl methacrylate) (PBMA) were prepared by spin-casting onto silicon wafers in order to map the lateral distribution of the two polymers. The surfaces were examined by atomic force microscopy (AFM) secondary ion mass spectroscopy X-ray photoelectron spectroscopy (XPS) and photoemission electron microscopy (PEEM). Films with PBMA contents of 50% w/w or less were relatively smooth, but further increase in the PBMA content produced, initially, protruding PS ribbons and then, for PBMA ≥80% w/w, isolated PS islands. At all concentrations the topmost surface (0.5–1.0 nm) was covered by PBMA, whilst the PBMA concentration in the near-surface region, measured by XPS, increased with bulk content to eventual saturation. PEEM measurements of a PS–PBMA film at the composition at which ribbon features were observed by AFM also showed a PS-rich ribbon structure surrounded by a sea of mainly PBMA.

Key words Polymer blends Thin films Topography Polystyrene 

Copyright information

© Springer-Verlag Berlin Heidelberg 2000

Authors and Affiliations

  • S. Affrossman
    • 1
  • R. Jerome
    • 2
  • S. A. O'Neill
    • 1
  • T. Schmitt
    • 3
  • M. Stamm
    • 4
  1. 1.Department of Pure and Applied Chemistry, University of Strathclyde Cathedral Street, Glasgow G1 1XL, UKGB
  2. 2.Centre for Education and Research on Macromolecules, University of Liege Sart-Tilman B6, 4000 Liège, BelgiumBE
  3. 3.Max-Planck-Institut für Polymerforschung, Postfach 3148, 55021 Mainz GermanyDE
  4. 4.Institut für Polymerforschung Dresden e. V., Hohe Strasse 6, Postfach 12 04 11 01005 Dresden, GermanyDE

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