Applied Physics B

, Volume 69, Issue 5–6, pp 455–458

Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe

  • W.M. Steffens
  • S. Heisig
  • U.D. Keil
  • E. Oesterschulze
Regular paper

DOI: 10.1007/s003400050834

Cite this article as:
Steffens, W., Heisig, S., Keil, U. et al. Appl Phys B (1999) 69: 455. doi:10.1007/s003400050834
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Abstract.

We report on the fabrication process of a scanning force microscopy (SFM) cantilever probe suitable for the investigation of ultrafast transient signals in microwave integrated circuits. High temporal resolution is achieved by integrating a laser-gated photoconductive switch within a coplanar waveguide structure onto a low-temperature GaAs cantilever. This is demonstrated by temporal and spatio-temporal measurements performed on a coplanar strip line.

PACS: 07.79.-v; 07.79.Lh; 84.40; 42.65.Re 

Copyright information

© Springer-Verlag 1999

Authors and Affiliations

  • W.M. Steffens
    • 1
  • S. Heisig
    • 2
  • U.D. Keil
    • 3
  • E. Oesterschulze
    • 2
  1. 1.University of Kassel, Institute of Technical Electronics, 34132 Kassel, GermanyDE
  2. 2.University of Kassel, Institute of Technical Physics, 34132 Kassel, Germany (Fax: +49-561/804-4136, E-mail: oester@physik.uni-kassel.de)DE
  3. 3.Microelektronik Centret DK-2800 Lyngby, DenmarkDK

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