Applied Physics B

, Volume 65, Issue 4–5, pp 549–554 | Cite as

Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique

  • X. Zhang
  • H. Fang
  • S. Tang
  • W. Ji

PACS: 42.65; 42.70 

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Copyright information

© Springer-Verlag 1997

Authors and Affiliations

  • X. Zhang
    • 1
  • H. Fang
    • 1
  • S. Tang
    • 1
  • W. Ji
    • 1
  1. 1.Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260SG

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