Applied Physics B

, Volume 64, Issue 5, pp 539–546

Z-scan measurements of photorefractive nonlinearities for a SBN: Ce crystal

  • S. Bian
  • J. Frejlich

DOI: 10.1007/s003400050212

Cite this article as:
Bian, S. & Frejlich, J. Appl Phys B (1997) 64: 539. doi:10.1007/s003400050212


 In this paper, we derived the Z-scan formula for a photorefractive crystal sample under an external applied electric field. The far-field diffraction pattern of a Gaussian beam wavefront through a photorefractive crystal is calculated by considering spatial-phase perturbation induced by the space-charge field. The photorefractive drift nonlinearities and correspondingly, the electro-optic coefficients r33, r13, (r23) and the characteristic ratio n3er33/n3or13 for a cerium-doped Sr0.61Ba0.39Nb2O6 crystal are determined from the Z-scan experiments. Z-scan with enhanced sensitivity is also realized by measuring the normalized transmittance at the off-axis position in the far field. A deviation between the off-axis Z-scan experimental results and the theoretical prediction is discussed too.

PACS: 42.65; 42.70G 

Copyright information

© Springer-Verlag Berlin Heidelberg 1997

Authors and Affiliations

  • S. Bian
    • 1
  • J. Frejlich
    • 1
  1. 1.Laboratório de Óptica, Instituto de Física, Universidade Estadual de Campinas 13083-970 Campinas, SP, BrazilBR

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