Applied Physics B

, 123:231 | Cite as

Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level

  • Ye Lang
  • Jianguo Xin
  • Kamal Alameh
  • Zhongwei Fan
  • Yanzhong Chen
  • Wenqi Ge
  • Hongbo Zhang
  • Lifen Liao


The transient thermal distribution and thermally induced beam quality (M 2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.



This work was supported by the National Key Scientific and Research Equipment Development Project of China (No. ZDYZ2013-2), the China Innovative Talent Promotion Plans for Innovation Team in Priority Fields (No. 2014RA4051), the National Natural Science Foundation of China (No.61605214) and the Innovation Program of Academy of Opto-Electronics, Chinese Academy of Science (No. Y70B06A13Y).


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Copyright information

© Springer-Verlag GmbH Germany 2017

Authors and Affiliations

  1. 1.School of OptoelectronicsBeijing Institute of TechnologyBeijingPeople’s Republic of China
  2. 2.Academy of Opto-ElectronicsChinese Academy of ScienceBeijingPeople’s Republic of China
  3. 3.Electron Science Research InstituteEdith Cowan UniversityJoondalupAustralia
  4. 4.Harglo Applied Laser Technology Institute Co. LtdTianjinPeople’s Republic of China

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