Applied Physics B

, Volume 116, Issue 3, pp 585–591 | Cite as

The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

  • Christoph LemkeEmail author
  • Till Leißner
  • Alwin Klick
  • Jacek Fiutowski
  • Jörn Willers Radke
  • Martin Thomaschewski
  • Jakob Kjelstrup-Hansen
  • Horst-Günter Rubahn
  • Michael Bauer


Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.


Surface Plasmon Polaritons Electron Energy Loss Spectroscopy Excitation Laser Pulse Beat Pattern Surface Plasmon Polaritons Wave 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



Thanks go to Carsten Reinhardt from the Laserzentrum Hannover for helpful discussion. This work was funded by the German Research Foundation (DFG) through Priority Program 1391 "Ultrafast Nanooptics" as well as by the Danish Council for Independent Research (FTP project ANAP, contract No. 09-072949).

Supplementary material

AVI (3024 KB)


  1. 1.
    E. Ozbay, Science 311(5758), 189 (2006)ADSCrossRefGoogle Scholar
  2. 2.
    H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, 1st edn. (Springer, Berlin/Heidelberg, 1988), pp. 4–7Google Scholar
  3. 3.
    A. Politano, V. Formoso, G. Chiarello, Plasmonics 3(4), 165 (2008)CrossRefGoogle Scholar
  4. 4.
    K. Wang, D. Mittleman, Phys. Rev. Lett. 96(15), 157401 (2006)ADSCrossRefGoogle Scholar
  5. 5.
    G. Schider, J. Krenn, A. Hohenau, H. Ditlbacher, A. Leitner, F. Aussenegg, W. Schaich, I. Puscasu, B. Monacelli, G. Boreman, Phys. Rev. B 68(15), 155427 (2003)ADSCrossRefGoogle Scholar
  6. 6.
    M. Shibuta, T. Eguchi, A. Nakajima, Plasmonics 8(3), 1411–1415 (2013)CrossRefGoogle Scholar
  7. 7.
    T. Leißner, C. Lemke, J. Fiutowski, J.W. Radke, A. Klick, L. Tavares, J. Kjelstrup-Hansen, H.G. Rubahn, M. Bauer, Phys. Rev. Lett. 111(4), 46802 (2013)ADSCrossRefGoogle Scholar
  8. 8.
    T. Leißner, C. Lemke, S. Jauernik, M. Müller, J. Fiutowski, L. Tavares, K. Thilsing-Hansen, J. Kjelstrup-Hansen, O. Magnussen, H.G. Rubahn, M. Bauer, Opt. Express 21(7), 8251 (2013)ADSCrossRefGoogle Scholar
  9. 9.
    I.P. Radko, J. Fiutowski, L. Tavares, H.G. Rubahn, S.I. Bozhevolnyi, Opt. Express 19(16), 15155 (2011)ADSCrossRefGoogle Scholar
  10. 10.
    F. Balzer, V. Bordo, A. Simonsen, H.G. Rubahn, Phys. Rev. B 67(11), 115408 (2003)ADSCrossRefGoogle Scholar
  11. 11.
    W. Swiech, G. Fecher, C. Ziethen, O. Schmidt, G. Schönhense, K. Grzelakowski, C.M. Schneider, R. Frömter, H. Oepen, J. Kirschner, J. Electron Spectros. Relat. Phenomena. 84(1–3), 171 (1997)CrossRefGoogle Scholar
  12. 12.
    O. Schmidt, M. Bauer, C. Wiemann, R. Porath, M. Scharte, O. Andreyev, G. Schönhense, M. Aeschlimann, Appl. Phys. B Lasers Opt. 74(3), 223 (2002)ADSCrossRefGoogle Scholar
  13. 13.
    L. Douillard, F. Charra, Z. Korczak, R. Bachelot, S. Kostcheev, G. Lerondel, P.M. Adam, P. Royer, Nano Lett. 8(3), 935 (2008)ADSCrossRefGoogle Scholar
  14. 14.
    M. Cinchetti, A. Gloskovskii, S. Nepjiko, G. Schönhense, H. Rochholz, M. Kreiter, Phys. Rev. Lett. 95(4), 47601 (2005)ADSCrossRefGoogle Scholar
  15. 15.
    C. Lemke, T. Leißner, S. Jauernik, A. Klick, J. Fiutowski, J. Kjelstrup-Hansen, H.G. Rubahn, M. Bauer, Opt. Express 20(12), 12877 (2012)ADSCrossRefGoogle Scholar
  16. 16.
    F. Meyerzu Heringdorf, N. Buckanie, Microsc. Microanal. 16(S2), 502 (2010)ADSCrossRefGoogle Scholar
  17. 17.
    T. Leißner, K. Thilsing-Hansen, C. Lemke, S. Jauernik, J. Kjelstrup-Hansen, M. Bauer, H.G. Rubahn, Plasmonics 7(2), 253 (2011)CrossRefGoogle Scholar
  18. 18.
    A. Kubo, N. Pontius, H. Petek, Nano Lett. 7(2), 470 (2007)ADSCrossRefGoogle Scholar
  19. 19.
    R. Olmon, B. Slovick, T. Johnson, D. Shelton, S.H. Oh, G. Boreman, M. Raschke, Phys. Rev. B 86(23), 235147 (2012)ADSCrossRefGoogle Scholar
  20. 20.
    P.B. Johnson, R.W. Christy, Phys. Rev. B 6(12), 4370 (1972)ADSCrossRefGoogle Scholar
  21. 21.
    L. Zhang, A. Kubo, L. Wang, H. Petek, T. Seideman, Phys. Rev. B 84(24), 245442 (2011)ADSCrossRefGoogle Scholar
  22. 22.
    C. Lemke, C. Schneider, T. Leißner, D. Bayer, J.W. Radke, A. Fischer, P. Melchior, A.B. Evlyukhin, B.N. Chichkov, C. Reinhardt, M. Bauer, M. Aeschlimann, Nano Lett. 13(3), 1053 (2013)ADSCrossRefGoogle Scholar
  23. 23.
    S.A. Nepijko, N.N. Sedov, G. Schönhense, M. Escher, X. Bao, W. Huang, Annalen Der Physik 9(6), 441 (2000)ADSCrossRefGoogle Scholar
  24. 24.
    P. Lalanne, Surf. Sci. Rep. 64(10), 453 (2009)ADSGoogle Scholar
  25. 25.
    T. Holmgaard, S. Bozhevolnyi, Phys. Rev. B 75(24), 245405 (2007)ADSCrossRefGoogle Scholar
  26. 26.
    A. Niko, S. Tasch, F. Meghdadi, C. Brandstatter, G. Leising, C. Brandstätter, J. Appl. Phys. 82(9), 4177 (1997)ADSCrossRefGoogle Scholar
  27. 27.
    V. Bordo, Phys. Rev. B 73(20), 205117 (2006)ADSCrossRefGoogle Scholar
  28. 28.
    R.M. de Oliveira Hansen, J. Kjelstrup-Hansen, H.G. Rubahn, Nanoscale 2(1), 134 (2010)ADSCrossRefGoogle Scholar
  29. 29.
    E. Zojer, M. Knupfer, R. Resel, F. Meghdadi, G. Leising, J. Fink, Phys. Rev. B 56(16), 10138 (1997)ADSCrossRefGoogle Scholar
  30. 30.
    F. Träger (ed.), Springer Handbook of Lasers and Optics (Springer, New York, 2007)Google Scholar
  31. 31.
    R.F. Egerton, P. Li, M. Malac, Micron (Oxford, England, 1993) 35(6), 399 (2004)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Christoph Lemke
    • 1
    Email author
  • Till Leißner
    • 1
  • Alwin Klick
    • 1
  • Jacek Fiutowski
    • 2
  • Jörn Willers Radke
    • 1
  • Martin Thomaschewski
    • 1
  • Jakob Kjelstrup-Hansen
    • 2
  • Horst-Günter Rubahn
    • 2
  • Michael Bauer
    • 1
  1. 1.IEAP, University of KielKielGermany
  2. 2.Mads Clausen InstituteUniversity of Southern DenmarkSønderborgDenmark

Personalised recommendations