Applied Physics B

, Volume 84, Issue 1–2, pp 167–173 | Cite as

Single-metal-cluster local imaging: polarized scattered electric field calculation compared to the field’s modulus and phase observed in the optical near-field

  • S. GrésillonEmail author
  • R. Lecaque
  • L. Williame
  • J.C. Rivoal


Simultaneous topographical and near-field optical imaging have been performed on single gold particles of diameters close to 12 nm. The optical source is a linearly polarized laser diode operating at λ=780 nm away from the plasmon resonance of the particles. The experimental optical image is recorded with an apertureless scanning near-field optical microscope (ASNOM) operating in transmission mode. It is compared to the components of the polarized scattered electric field around a single cluster calculated using Mie formalism. We show that the tip used in the experiments is sensitive to the axial component of the scattered field, thus allowing us to obtain the amplitude and the phase of the local field. Our derivation brings out new information, usually shaded when applied to an ensemble of particles. In particular, the dipole model widely used to describe the scattered field by a spherical particle is not suitable to describe the three components of the scattered field in the near zone. Our results are of interest for fundamental studies of the optical properties of single metal clusters and the control of local phenomena such as enhancement, extinction, etc.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    M. Faraday, Philos. Trans. R. Soc. London 147, 145 (1857)ADSCrossRefGoogle Scholar
  2. 2.
    C.G. Granqvist, O. Hunderi, Phys. Rev. B 16, 3513 (1977)CrossRefADSGoogle Scholar
  3. 3.
    J.L. Gardea-Torresdey, J.G. Parsons, E. Gomez, J. Perelta-Videa, H.E. Troiani, P. Santiago, M.S. Yacaman, Nano Lett. 2, 397 (2002)CrossRefADSGoogle Scholar
  4. 4.
    S.S. Shankar, A. Ahmad, R. Pasricha, M. Satry, J. Mater. Chem. 13, 1822 (2003)CrossRefGoogle Scholar
  5. 5.
    L. Cognet, C. Tardin, D. Boyert, D. Choquet, P. Tamarat, B. Lounis, Proc. Nat. Acad. Sci. 100, 11350 (2003)CrossRefPubMedADSGoogle Scholar
  6. 6.
    K.L. Kelly, E. Coronado, L.L. Zhao, G.C. Schatz, J. Phys. Chem. B 107, 668 (2003)CrossRefGoogle Scholar
  7. 7.
    T. Klar, M. Perner, S. Grosse, G. von Plessen, W. Spirkl, J. Feldmann, Phys. Rev. Lett. 80, 4249 (1998)CrossRefADSGoogle Scholar
  8. 8.
    K. Lindfors, T. Kalkbrenner, P. Stoller, V. Sandoghdar, Phys. Rev. Lett. 93, 037401 (2004)CrossRefPubMedADSGoogle Scholar
  9. 9.
    A. Arbouet, D. Christofilos, N. DelFatti, F. Vallée, J.R. Huntzinger, L. Arnaud, P. Billaud, M. Broyer, Phys. Rev. Lett. 93, 127401 (2004)CrossRefPubMedADSGoogle Scholar
  10. 10.
    S. Berciaud, L. Cognet, G.A. Blab, B. Lounis, Phys. Rev. Lett. 93, 257402 (2004)CrossRefPubMedADSGoogle Scholar
  11. 11.
    Proc. 8th Int. Conf. on Near-field Nano Optics and Related Techniques, Vol. 9, Section A, 2004, City Publishing House, Wonho Jhe Ed.Google Scholar
  12. 12.
    D. Courjon, C. Bainier (Eds.), Le champ proche optique. Theorie et applications (Springer, Paris, 2001)Google Scholar
  13. 13.
    C.J. Hill, P.M. Bridger, G.S. Picus, T.C. McGill, Appl. Phys. Lett. 75, 4022 (1999)CrossRefADSGoogle Scholar
  14. 14.
    M.B. Raschke, C. Lienau, Appl. Phys. Lett. 83, 5089 (2003)CrossRefADSGoogle Scholar
  15. 15.
    G.C. Cho, H.-T. Chen, S. Kraatz, N. Karpowicz, R. Kersting, Semicond. Sci. Technol. 20, S286 (2005)CrossRefGoogle Scholar
  16. 16.
    A. Roberts, J. Appl. Phys. 70, 4045 (1991)CrossRefADSGoogle Scholar
  17. 17.
    H. Cory, A.C. Boccara, J.C. Rivoal, A. Lahrech, Microwave Opt. Technol. Lett. 18, 120 (1998)CrossRefGoogle Scholar
  18. 18.
    L. Novotny, E.J. Sanchez, X.S. Xie, Ultramicroscopy 71, 21 (1998)CrossRefGoogle Scholar
  19. 19.
    E.J. Sanchez, L. Novotny, X.S. Xie, Phys. Rev. Lett. 82, 4014 (1999)CrossRefADSGoogle Scholar
  20. 20.
    S. Ducourtieux, S. Gresillon, J.C. Rivoal, C. Vannier, C. Bainier, D. Courjon, H. Cory, Eur. Phys. J. Appl. Phys. 26, 35 (2004)CrossRefADSGoogle Scholar
  21. 21.
    G. Mie, Ann. Phys. 25, 377 (1908)CrossRefGoogle Scholar
  22. 22.
    C.F. Bohren, D.R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1998)CrossRefGoogle Scholar
  23. 23.
    S. Ducourtieux, Ph. D. Thesis, University Pierre et Marie Curie (Paris 6) (2001)Google Scholar
  24. 24.
    S. Gresillon, H. Cory, J.C. Rivoal, A.C. Boccara, J. Opt. A 1, 178 (1999)ADSCrossRefGoogle Scholar
  25. 25.
    E. Betzig, J.K. Trautman, J.S. Weiner, T.D. Harris, R. Wolfe, Appl. Opt. 31, 4563 (1992)ADSCrossRefGoogle Scholar
  26. 26.
    S. Aubert, A. Bruyant, S. Blaize, R. Bachelot, G. Lerondel, S. Hudlet, P. Royer, J. Opt. Soc. Am. B 20, 2117 (2003)ADSCrossRefGoogle Scholar
  27. 27.
    C. Matzler, MATLAB functions for Mie scattering and absorption, 2002, Institut für Angewandte Physik, University of Bern – CHGoogle Scholar
  28. 28.
    D.W. Lynch, W.R. Hunter, E.D. Palik (Eds.) Handbook of Optical Constants of Solids (Academic Press, London, 1998)Google Scholar
  29. 29.
    R. Hillenbrand, F. Keilmann, Phys. Rev. Lett. 85, 3029 (2000)CrossRefPubMedADSGoogle Scholar
  30. 30.
    J.A. Porto, R. Carminati, J.-J. Greffet, J. Appl. Phys. 88, 4845 (2000)CrossRefADSGoogle Scholar
  31. 31.
    L. Aigouy, F.X. Andreani, A.C. Boccara, J.C. Rivoal, J.A. Porto, R. Carminati, J.J. Greffet, R. Megy, Appl. Phys. Lett. 76, 397 (2000)CrossRefADSGoogle Scholar
  32. 32.
    C. Bainier, C. Vannier, D. Courjon, J.C. Rivoal, S. Ducourtieux, Y. deWilde, L. Aigouy, F. Formanek, L. Belliard, P. Siry, B. Perrin, Appl. Opt. 42, 691 (2003)PubMedADSCrossRefGoogle Scholar
  33. 33.
    R. Hillenbrand, F. Keilmann, Appl. Phys. Lett. 80, 25 (2002)CrossRefADSGoogle Scholar
  34. 34.
    L. Aigouy, V. Mathet, P. Beauvillain, Opt. Comm., in press, DOI: 10.1016/j.optcom.2005.12.053Google Scholar
  35. 35.
    N. Anderson, A. Bouhelier, L. Novotny, J. Opt A 8, S227 (2006)ADSCrossRefGoogle Scholar
  36. 36.
    A. Fragola, L. Aigouy, P.Y. Mignotte, F. Formanek, Y. DeWilde, Ultramicroscopy 101, 47 (2004)CrossRefPubMedGoogle Scholar

Copyright information

© Springer-Verlag 2006

Authors and Affiliations

  • S. Grésillon
    • 1
    Email author
  • R. Lecaque
    • 1
  • L. Williame
    • 1
  • J.C. Rivoal
    • 1
  1. 1.ESPCILaboratoire de Spectroscopie en Lumiere Polarisee UPR5-CNRS and University P. et M. CurieParis Cedex 05France

Personalised recommendations