Applied Physics B

, Volume 79, Issue 7, pp 857–862 | Cite as

Time-related luminescence spectroscopic investigation of electron trapping and recombination in infrared stimulated luminescence

Article
  • 46 Downloads

Abstract

Infrared stimulated luminescence (ISL) occurred in CaS:Eu,Sm due to formation of luminescent centres Eu2+ and electron trapping centres Sm3+. The electron trapping centres Sm3+ became occupied (forming Sm2+ by trapping excited electrons) in photoluminescence (PL) excitation (PLX) process causing simultaneous ionization of luminescent centres Eu2+ (leaving Eu3+ by losing an electron or capturing a hole). In this paper, the electron trapping in PLX and the recombination in ISL were examined by the time-related PL and ISL spectra of CaS:Eu,Sm. The spectroscopic evidence confirmed that the ISL in CaS:Eu,Sm was produced due to recombination of de-trapped electrons and previously ionized luminescent centres (Eu3+). It was believed that the electron trapping occurred concurrently as occurrence of the PL of Eu2+ in PLX process. However, the recombination of de-trapped electrons and previously ionized luminescent centres took about 10 μs or even more to occur after infrared irradiation.

Keywords

Spectroscopy Physical Chemistry Recombination Apply Physic Quantum Electronics 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S.K. Keller, J.E. Mapes, G. Cheroff: Phys. Rev. 108, 663 (1957)CrossRefGoogle Scholar
  2. 2.
    S.P. Keller: J. Chem. Phys. 29, 180 (1958)Google Scholar
  3. 3.
    S.P. Keller: Phys. Rev. 113, 1415 (1959)CrossRefGoogle Scholar
  4. 4.
    J. Lindmayer: Solid State Technol. 8, 135 (1988)Google Scholar
  5. 5.
    J. Lindmayer: Laser Focus World 25, 119 (1989)Google Scholar
  6. 6.
    P. Goldsmith, J. Lindmayer, C.Y. Wrigley, Proc. SPIE 1316, 175 (1990)Google Scholar
  7. 7.
    H. Nanto, Y. Douguchi, J. Nishishita: Jpn. J. Appl. Phys. 36, 421 (1997)CrossRefGoogle Scholar
  8. 8.
    Y. Tamura, A. Shibukawa: Jpn. J. Appl. Phys. 32, 3187 (1998)Google Scholar
  9. 9.
    J. Wu, D. Newman, I. Viney: J. Phys. DAppl. Phys. 35, 968 (2002)CrossRefGoogle Scholar
  10. 10.
    W. Lehamn, J. Electrochem.: Solid State Sci. 118, 477 (1971)Google Scholar
  11. 11.
    W. Lehamn, J. Electrochem.: Solid State Sci. 118, 1164 (1971)Google Scholar
  12. 12.
    K. Chakrabarti, V.K. Mathur, J.F. Rhodes, R.J. Abbundi: J. Appl. Phys. 64, 1363 (1988)CrossRefGoogle Scholar
  13. 13.
    K. Chakrabarti, V.K. Mathur, L.A. Thomas, R.J. Abbundi: J. Appl. Phys. 65, 2021 (1989)CrossRefGoogle Scholar
  14. 14.
    J. Wu, D. Newman, I. Viney: J. Lumin. 99, 234 (2002)Google Scholar
  15. 15.
    A.R. Calderbank, R. Laroia, S.W. Mclaughlin: IEEE Trans. on Commun. 46, 1011 (1998)Google Scholar
  16. 16.
    K. Hirao, J. Qiu, Y. Shimizugawa: Jpn. J. Appl. Phys. 37, 2259 (1998)CrossRefGoogle Scholar
  17. 17.
    D. Jia, W. Jia, D.R. Evans, W.M. Dennis, H. Liu, J. Zhu, W.M. Yen: J. Appl. Phys. 88, 3402 (2000)CrossRefGoogle Scholar
  18. 18.
    K. Wakita: Appl. Phys. Lett. 80, 3316 (2002)CrossRefGoogle Scholar
  19. 19.
    S.W. Jung: Appl. Phys. Lett. 80, 1924 (2002)CrossRefGoogle Scholar
  20. 20.
    Z. He, Y. Wang, L. Sun, X. Xu: Acta Phys. Sin. 49, 1377 (2000)Google Scholar
  21. 21.
    J. Wu, D. Newman, I. Viney: Appl. Phys. B 79, 239 (2004)CrossRefGoogle Scholar
  22. 22.
    D. Jia, J. Zhu, B. Wu: J. Electrochem. Soc. 147, 386 (2000)CrossRefGoogle Scholar
  23. 23.
    L.H. Robins, J.A. Tuchman: Phys. Rev. B 57, 12094 (1998)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  1. 1.Engineering DepartmentQueen Mary, University of LondonLondonUK
  2. 2.School of Engineering Computer Science & MathematicsUniversity of ExeterExeterUK
  3. 3.Coventry UniversityCoventryUK

Personalised recommendations