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Applied Physics B

, Volume 78, Issue 3–4, pp 443–446 | Cite as

Identification of multiphoton induced photocurrents in metal–insulator–metal junctions

  • D. Diesing
  • M. Merschdorf
  • A. Thon
  • W. Pfeiffer
Article

Abstract

Illumination of metal–insulator–metal junctions with ultrashort laser pulses and multiphoton electron excitation in the top electrode leads to the injection of electrons into the backside electrode. Time resolved photocurrent spectroscopy shows that the carrier injection is not instantaneous but occurs with an effective lifetime of about 30 fs. The observation of an effective lifetime reveals that photon-assisted tunneling is negligible. It is shown that three-photon induced internal photoemission and two-photon induced tunneling of excited electrons are the dominating transport mechanisms.

Keywords

Spectroscopy Laser Pulse Transport Mechanism Electron Excitation Excited Electron 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • D. Diesing
    • 1
  • M. Merschdorf
    • 2
  • A. Thon
    • 2
  • W. Pfeiffer
    • 2
  1. 1.Institut für Schichten und GrenzflächenForschungszentrum JülichJülichGermany
  2. 2.Physikalisches InstitutUniversität WürzburgWürzburgGermany

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