Applied Physics B

, Volume 77, Issue 1, pp 49–57 | Cite as

High-repetition-rate hard X-ray generation with sub-millijoule femtosecond laser pulses

  • M. Hagedorn
  • J. Kutzner
  • G. Tsilimis
  • H. Zacharias
Regular Paper

Abstract

Hard X-ray radiation is generated at 1-kHz repetition rate on metal targets using 30-fs sub-millijoule laser pulses. Spinning-disc targets of medium-Z (Ti, Cr, Fe, Ni, Cu, Zn and Mo) and high-Z (Ta) metals are investigated. For medium-Z targets, characteristic K-shell emission (Kα and Kβ) is observed in the 4–20 keV energy range in addition to a broadband bremsstrahlung background. Whereas in former studies similar results have been obtained by applying laser pulses in the tens-to-hundreds-of-millijoules range, we observe characteristic X-ray generation even at applied pulse energies as low as 100 μJ. The well-defined emission wavelength, the high intensity and the high brightness of this radiation makes this source a promising tool for time-resolved experiments with high-repetition-rate (≥10 kHz) small-scale table-top laser systems .

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    H. Salzmann: J. Appl. Phys. 44, 113 (1973) ADSCrossRefGoogle Scholar
  2. 2.
    D. Kühlke, U. Herpers, D. von der Linde: Appl. Phys. Lett. 50, 1785 (1987) ADSCrossRefGoogle Scholar
  3. 3.
    J.D. Kmetec, C.L. Gordon III, J.J. Macklin, B.E. Lemoff, G.S. Brown, S.E. Harris: Phys. Rev. Lett. 68, 1527 (1992) ADSCrossRefGoogle Scholar
  4. 4.
    M. Berglund, L. Rymell, H.M. Hertz, T. Wilhein: Rev. Sci. Instrum. 69, 2361 (1998) ADSCrossRefGoogle Scholar
  5. 5.
    S. Düsterer, H. Schwoerer, R. Behrens, C. Ziener, C. Reich, P. Gibbon, R. Sauerbrey: Contrib. Plasma Phys. 41, 171 (2001) ADSCrossRefGoogle Scholar
  6. 6.
    A. Rousse, C. Rischel, J.C. Gauthier: Rev. Mod. Phys. 73, 17 (2001) ADSCrossRefGoogle Scholar
  7. 7.
    E.C. Eder, G. Pretzler, E. Fill, K. Eidmann, A. Saemann: Appl. Phys. B 70, 211 (2000) ADSCrossRefGoogle Scholar
  8. 8.
    N. Takeyasu, Y. Hirakawa, T. Imasaka: Appl. Phys. Lett. 78, 1195 (2001) ADSCrossRefGoogle Scholar
  9. 9.
    G. Korn, A. Thoss, M. Faubel, H. Stiel, U. Vogt, M. Richardson, T. Elsässer: Opt. Lett. 27, 866 (2002) ADSCrossRefGoogle Scholar
  10. 10.
    P. Gibbon, E. Förster: Plasma Phys. Control. Fusion 38, 769 (1996) ADSCrossRefGoogle Scholar
  11. 11.
    T. Missalla, I. Uschmann, E. Förster, G. Jenke, D. von der Linde: Rev. Sci. Instrum. 70, 1288 (1999) ADSCrossRefGoogle Scholar
  12. 12.
    M. Yoshida, Y. Fujimoto, Y. Hironaka, K.G. Nakamura, K. Kondo, M. Ohtani, H. Tsunemi: Appl. Phys. Lett. 73, 2393 (1998) ADSCrossRefGoogle Scholar
  13. 13.
    Y. Fujimoto, Y. Hironaka, K.G. Nakamura, K. Kondo, M. Yoshida, M. Ohtani, H. Tsunemi: Jpn. J. Appl. Phys. 38, 6754 (1999) ADSCrossRefGoogle Scholar
  14. 14.
    Y. Hironaka, K.G. Nakamura, K. Kondo: Appl. Phys. Lett. 77, 4110 (2000) ADSCrossRefGoogle Scholar
  15. 15.
    T. Feurer, A. Morak, I. Uschmann, C. Ziener, H. Schwoerer, E. Förster, R. Sauerbrey: Appl. Phys. B 72, 15 (2001) ADSCrossRefGoogle Scholar
  16. 16.
    C. Rischel, A. Rousse, I. Uschmann, P.A. Albouy, J.C. Gauthier, E. Förster, J.L. Martin, A. Antonetti: Nature 390, 490 (1997) ADSCrossRefGoogle Scholar
  17. 17.
    C.W. Sider, A. Cavalleri, K. Sokolowski-Tinten, C. Tóth, T. Guo, M. Kammler, M. Horn von Hoegen, K.R. Wilson, D. von der Linde, C.P.J. Barty: Science 286, 1340 (1999) CrossRefGoogle Scholar
  18. 18.
    A. Cavalleri, C.W. Siders, F.L.H. Brown, D.M. Leitner, C. Tóth, J.A. Squier, C.P.J. Barty, K.R. Wilson, K. Sokolowski-Tinten, M. Horn von Hoegen, D. von der Linde, M. Kammler: Phys. Rev. Lett. 85, 586 (2000) ADSCrossRefGoogle Scholar
  19. 19.
    A. Cavalleri, C.W. Siders, C. Rose-Petruck, R. Jimenez, C. Tóth, J.A. Squier, C.P.J. Barty, K.R. Wilson, K. Sokolowski-Tinten, M. Horn von Hoegen, D. von der Linde: Phys. Rev. B 63, 194406 (2001) CrossRefGoogle Scholar
  20. 20.
    J. Liu, J. Nees, M. Wilcox, H. Wang, B. Shan, O. Albert, G. Mourou, Z. Chang: “Microfocus X-ray generation with a high repetition rate laser,” in: OSA Trends in Optics and Photonics (TOPS) Vol. 65, Applications of High Field and Short Wavelength Sources IX, OSA Technical Digest, Postconference Edition (Optical Society of America, Washington DC, 2001) Google Scholar
  21. 21.
    M. Hagedorn, J. Kutzner, G. Tsilimis, H. Zacharias: Verhandl. DPG (VI) 37, 2/149 (2002) Google Scholar
  22. 22.
    Y. Jiang, T. Lee, W. Li, G. Ketwaroo, C.G. Rose-Petruck: Opt. Lett. 27, 963 (2002) ADSCrossRefGoogle Scholar
  23. 23.
    R.J. Tompkins, I.P. Mercer, M. Fettweis, C.J. Barnett, D.R. Klug, L.G. Porter, I. Clark, S. Jackson, P. Matousek, A.W. Parker, M. Towrie: Rev. Sci. Instr. 69, 3113 (1998) ADSCrossRefGoogle Scholar
  24. 24.
    C.S. Rossington, R.D. Giauque, J.M. Jaklevic: IEEE Trans. Nucl. Sci. 39, 570 (1992) ADSCrossRefGoogle Scholar
  25. 25.
    A. Thompson, D. Attwood, E. Gullikson, M. Howells, K.J. Kim, J. Kirz, J. Kortright, I. Lindau, P. Pianetta, A. Robinson, J. Scofield, J. Underwood, D. Vaughan, G. Williams, H. Winick: X-Ray Data Booklet (LBNL, Berkeley 2001) Google Scholar
  26. 26.
    B. Gstir, H. Deutsch, K. Becker, T.D. Märk: J. Phys. B 34, 3377 (2001) ADSCrossRefGoogle Scholar
  27. 27.
    X. Llovet, C. Merlet, F. Salvat: J. Phys. B At. Mol. Opt. Phys. 33, 3761 (2000) ADSCrossRefGoogle Scholar
  28. 28.
    D. Attwood: Soft X-Rays and Extreme Ultraviolet Radiation (Cambridge University Press, Cambridge 1999) Google Scholar
  29. 29.
    W. Rozmus, V.T. Tikhonchuk: Phys. Rev. A 42, 7401 (1990) ADSCrossRefGoogle Scholar
  30. 30.
    W. Rozmus, V.T. Tikhonchuk: Phys. Rev. A 46, 7810 (1992) ADSCrossRefGoogle Scholar
  31. 31.
    A. Rousse, P. Audebert, J.P. Geindre, F. Falliès, J.C. Gautier, A. Mysyrowicz, G. Grillon, A. Antonetti: Phys. Rev. E 50, 2200 (1994) ADSCrossRefGoogle Scholar
  32. 32.
    P. Gibbon: Phys. Rev. Lett. 73, 664 (1994) ADSCrossRefGoogle Scholar
  33. 33.
    G. Pretzler, T. Schlegel, E. Fill, D. Eder: Phys. Rev. E 62, 5618 (2000) ADSCrossRefGoogle Scholar
  34. 34.
    V.M. Gordienko, I.M. Lachko, P.M. Mikheev, A.B. Savel’ev, D.S. Uryupina R.V. Volkov: Plasma Phys. Control. Fusion 44, 2555 (2002) ADSCrossRefGoogle Scholar
  35. 35.
    R.C. Weast, M.S. Astle: CRC Handbook of Chemistry and Physics (CRC Press, Boca Raton 1982) Google Scholar
  36. 36.
    J.N. Broughton, R. Fedosejevs: J. Appl. Phys. 74, 3712 (1993) ADSCrossRefGoogle Scholar
  37. 37.
    P. Zhang, J.T. He, D.B. Chen, Z.H. Li, Y. Zhang, J.G. Bian, L. Wang, Z.L. Li, B.H. Feng, X.L. Zhang, D.X. Zhang, X.W. Tang, J. Zhang: Phys. Rev. E 57, R3746 (1998) Google Scholar
  38. 38.
    E. Fill, J. Bayerl, R. Tommasini: Rev. Sci. Instrum. 73, 2190 (2002) ADSCrossRefGoogle Scholar
  39. 39.
    F. Ewald, H. Schwoerer, R. Sauerbrey: Europhys. Lett. 60, 710 (2002) ADSCrossRefGoogle Scholar
  40. 40.
    C.W. Siders, A. Cavalleri, K. Sokolowski-Tinten, T. Guo, C. Töth, R. Jimenez, C. Rose-Petruck, M. Kammler, M. Horn von Hoegen, D. von der Linde, K.R. Wilson, C.P.J. Barty: SPIE Proc. 3776, 302 (1999) ADSCrossRefGoogle Scholar
  41. 41.
    M. Berglund, L. Rymell, H.M. Hertz: Appl. Phys. Lett. 69, 1683 (1996) ADSCrossRefGoogle Scholar
  42. 42.
    S. Backus, R. Bartels, S. Thompson, R. Dollinger, H.C. Kapteyn, M.M. Murnane: Opt. Lett. 26, 465 (2001) ADSCrossRefGoogle Scholar
  43. 43.
    J. Kutzner, M. Hagedorn, G. Tsilimis, H. Zacharias: Verhandl. DPG (VI) 38, 6/133 (2003)Google Scholar
  44. 44.
    X. Long, M. Liu, F. Ho, X. Peng: At. Data Nucl. Data Tables 45, 353 (1990) ADSCrossRefGoogle Scholar
  45. 45.
    H. Deutsch, K. Becker, B. Gstir, T.D. Märk: Int. J. Mass Spectr. 213, 5 (2002)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag 2003

Authors and Affiliations

  • M. Hagedorn
    • 1
  • J. Kutzner
    • 1
  • G. Tsilimis
    • 1
  • H. Zacharias
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms UniversitätMünsterGermany

Personalised recommendations