Applied Physics A

, Volume 74, Issue 2, pp 205–211 | Cite as

Structure, refractive-index dispersion and the optical absorption edge of chemically deposited ZnxCd(1-x)S thin films

  • A.M. Salem


Zinc cadmium sulfide, ZnxCd(1-x)S, thin films have been deposited by a simple and inexpensive chemical bath deposition method from an aqueous medium using thiourea as a sulfide-ion source. The structure of the deposited films has been characterized by X-ray diffraction and transmission electron microscopy. It was observed from X-ray diffraction that the as-deposited films were amorphous in nature. However ZnxCd(1-x)S films annealed at 423 K for 1.5 h show a crystalline structure with a small scattering volume. The obtained results were confirmed throughout the transmission electron microscopy and the corresponding electron-diffraction patterns. The optical constants of ZnxCd(1-x)S films annealed at 423 K for 1.5 h in the compositional range 0≤x≤1 were estimated using transmission and reflection spectra in the wavelength range 300–2500 nm. The band gap varies non-linearly with the value of x. The dependence of the refractive index on the wavelength obeys the single-oscillation model, from which the dispersion parameters and the high-frequency dielectric constant were determined. A graphical representation of the surface and volume energy-loss functions was also given.

PACS: 78.65; 78.50; 81.15; 78.2.-e 


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Copyright information

© Springer-Verlag 2001

Authors and Affiliations

  • A.M. Salem
    • 1
  1. 1.National Research Center, Physics Division, Electron Microscopy and Thin Films Laboratory, Dokki, Cairo, Egypt (Fax: +202-3370931, E-mail:

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