Applied Physics A

, Volume 72, Supplement 1, pp S39–S42

Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy

  • N. Sasaki
  • M. Tsukada
Invited paper

Abstract.

An exact analytical formula of the frequency shift and dissipated power in noncontact atomic force microscopy (nc-AFM) is obtained, in the case of a tip–surface interaction force with an inverse power law. The frequency shift for various tip shapes is evaluated. It is confirmed that the tip-height dependence of the analytical frequency shift shows very good agreement with that of the experimental one. The tip-height dependence of the dissipated power derived from a Langevin equation approach is also evaluated.

PACS: 61.16.Ch; 62.20.-x; 68.65.+g; 81.40.Pq 

Copyright information

© Springer-Verlag 2001

Authors and Affiliations

  • N. Sasaki
    • 1
  • M. Tsukada
    • 3
  1. 1.Department of Materials Engineering, Graduate School of Engineering, University of Tokyo, 7–3–1 Hongo, Bunkyo-ku, Tokyo 113-8656, JapanJP
  2. 2.Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Corporation, 2-1-6 Sengen, Tsukuba-shi, Ibaraki 305-0047, JapanJP
  3. 3.Department of Physics, Graduate School of Science, University of Tokyo, 7–3–1 Hongo, Bunkyo-ku, Tokyo 113-0033, JapanJP

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