Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy
- First Online:
- 63 Downloads
An exact analytical formula of the frequency shift and dissipated power in noncontact atomic force microscopy (nc-AFM) is obtained, in the case of a tip–surface interaction force with an inverse power law. The frequency shift for various tip shapes is evaluated. It is confirmed that the tip-height dependence of the analytical frequency shift shows very good agreement with that of the experimental one. The tip-height dependence of the dissipated power derived from a Langevin equation approach is also evaluated.