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Applied Physics A

, Volume 66, Supplement 1, pp S397–S402 | Cite as

Assessment of NSOM resolution on III-V semiconductor thin films

  • M. Labardi
  • P.G. Gucciardi
  • M. Allegrini
  • C. Pelosi
Regular paper

PACS: 61.16.Ch, 07.60Pb 

Copyright information

© Springer-Verlag 1998

Authors and Affiliations

  • M. Labardi
    • 1
  • P.G. Gucciardi
    • 1
  • M. Allegrini
    • 1
  • C. Pelosi
    • 2
  1. 1.Istituto Nazionale per la Fisica della Materia, Dipartimento di Fisica, Università di Pisa, Piazza Torricelli 2, I-56126 Pisa, Italy (Fax: +39-50/48277, E-mail: labardi@mailbox.difi.unipi.it)IT
  2. 2.MASPEC/CNR, Via Chiavari 18/a, I-43100 Parma, ItalyIT

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