Applied Physics AMarch 1998, Volume 66, Supplement 1, pp S117–S120 | Cite asBallistic electron emission microscopy using InAs tips AuthorsAuthors and affiliationsJ. SmolinerR. HeerC. EderRegular paper 20 Downloads PACS: 73.20.Dx; 73.40.Gk; 73.40.Qv This is a preview of subscription content, log in to check access.Copyright information© Springer-Verlag 1998Authors and AffiliationsJ. Smoliner1R. Heer1C. Eder11.Institut für Festkörperelektronik & Mikrostrukturzentrum der TU-Wien, Floragasse 7, A-1040 Wien, Austria (Fax: +43-1/504-55259, E-mail: smooli@macmisz.fke.tuwien.ac.at)AT