Applied Physics A

, Volume 66, Supplement 1, pp S117–S120 | Cite as

Ballistic electron emission microscopy using InAs tips

  • J. Smoliner
  • R. Heer
  • C. Eder
Regular paper
  • 20 Downloads

PACS: 73.20.Dx; 73.40.Gk; 73.40.Qv 

Copyright information

© Springer-Verlag 1998

Authors and Affiliations

  • J. Smoliner
    • 1
  • R. Heer
    • 1
  • C. Eder
    • 1
  1. 1.Institut für Festkörperelektronik & Mikrostrukturzentrum der TU-Wien, Floragasse 7, A-1040 Wien, Austria (Fax: +43-1/504-55259, E-mail: smooli@macmisz.fke.tuwien.ac.at)AT

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