Optoelectrical properties of Ge10Se90 and Ge10Se85Cu5 thin films illuminated by laser beams
- 87 Downloads
Abstract
The laser irradiation effect on the optoelectrical properties of Ge10Se90 and Ge10Se85Cu5 thin films in the view of Cu-doping effect has been investigated. The illumination effect leads to structural changes in compositions that result from electron–hole excitations, defect creation/modification, and subsequently atomic motions. The dispersion of the refractive index is discussed in terms of the single-oscillator model, non-linear optics, coordination number and lone-pair electrons. Adding Cu to the host glass decreased the band gap (photo-darkening effect). The optoelectrical properties of the studied films have been investigated in the view of the high-frequency dielectric constant\({ \epsilon }_{\infty }\), volume and surface energy loss functions VELF and SELF, the dielectric loss factor\(\delta\), the plasma frequency\({w}_{\text{p}}\), and the damping frequency\({ w}_{\text{d}}\). The above mentioned parameters are revealed to be effected upon Cu doping as well as laser irradiation. Our findings can be utilized in device applications for laser-activated switches and memories.
Notes
Acknowledgements
This work was done according to the agreement between Faculty of Education, Ain Shams University (Cairo-Egypt) (Prof. Suzan Fouad) and Faculty of Science and Technology, Debrecen University (Debrecen-Hungary) (Prof. Sándor Kökényesi).
References
- 1.A. Andriesh, M. Bertolotti, Physics and Applications of Non-crystalline Semiconductors in Optoelectronics. (Springer Science and Business Media, Berlin, 2012)Google Scholar
- 2.M. Iovu, D. Harea, I. Cojocaru, E. Colomeico, A. Prisacari, V. Ciorba, J. Optoelectron. Adv. Mater. 9, 3138–3142 (2007)Google Scholar
- 3.M.S. El-Bana, R. Bohdan, S.S. Fouad, J. Alloy. Compd. 686, 115–121 (2016)CrossRefGoogle Scholar
- 4.D. Lezal, J. Zavadil, M. Prochazka, J Optoelectron. Adv. Mater. 7, 2281–2291 (2005)Google Scholar
- 5.S. Charnovych, S. Kokenyesi, G. Glodán, A. Csik, Thin Solid Films 519, 4309–4312 (2011)ADSCrossRefGoogle Scholar
- 6.M. El-Nahass, M. Ali, I. Zedan, J. Lumin. 151, 143–148 (2014)CrossRefGoogle Scholar
- 7.A. Zakery, S. Elliott, J. Non-Cryst. Solids 330, 1–12 (2003)ADSCrossRefGoogle Scholar
- 8.A. Ganjoo, K. Shimakawa, K. Kitano, E. Davis, J. Non-Cryst. Solids 299, 917–923 (2002)ADSCrossRefGoogle Scholar
- 9.R. Frerichs, Physical Review, American Physical Soc. One Physics Ellipse, College PK, (1950), pp. 643–643Google Scholar
- 10.T. Cardinal, K. Richardson, H. Shim, A. Schulte, R. Beatty, K. Le Foulgoc, C. Meneghini, J. Viens, A. Villeneuve, J. Non-Cryst. Solids 256, 353–360 (1999)ADSCrossRefGoogle Scholar
- 11.J. Harbold, F. Ilday, F. Wise, J. Sanghera, V. Nguyen, L. Shaw, I. Aggarwal, Opt. Lett. 27, 119–121 (2002)ADSCrossRefGoogle Scholar
- 12.K. Ogusu, S. Maeda, M. Kitao, H. Li, M. Minakata, J. Non-Cryst. Solids 347, 159–165 (2004)ADSCrossRefGoogle Scholar
- 13.R. Pan, H. Tao, J. Wang, J. Wang, H. Chu, T. Zhang, D. Wang, X. Zhao, Opt. Int. J. Light Electron Opt. 124, 4943–4946 (2013)CrossRefGoogle Scholar
- 14.S. Fouad, Phys. B 293, 276–282 (2001)ADSCrossRefGoogle Scholar
- 15.H. El-Shair, M. El-Nahass, S. Fouad, Vacuum 42, 201–202 (1991)ADSCrossRefGoogle Scholar
- 16.H. El-Shair, S. Fouad, Vacuum 42, 463–467 (1991)ADSCrossRefGoogle Scholar
- 17.S. Fouad, S. Faek, S. El-Sayed, Vacuum 53, 415–419 (1999)CrossRefGoogle Scholar
- 18.S. Fouad, H. Talaat, S. Youssef, A. El-Korashy, M. El-Oker, Phys. Status Solidi B K51–K55, 187 (1995)Google Scholar
- 19.T.J. Carrig, J. Electr. Mater. 31, 759–769 (2002)ADSCrossRefGoogle Scholar
- 20.J. Hu, X. Sun, A.M. Agarwal, J.-F. Viens, L.C. Kimerling, L. Petit, N. Carlie, K.C. Richardson, T. Anderson, J. Choi, J. Appl. Phys. 101, 063520 (2007)ADSCrossRefGoogle Scholar
- 21.D.B. Khadka, J. Kim, J. Phys. Chem. C 119, 1706–1713 (2015)CrossRefGoogle Scholar
- 22.A.A. Bahishti, I. Uddin, M. Zulfequar, Int. Ann. Sci. 1, 8–14 (2016)CrossRefGoogle Scholar
- 23.G.B. Sakr, I.S. Yahia, M. Fadel, S.S. Fouad, N. Romčević, J. Alloy. Compd. 507, 557–562 (2010)CrossRefGoogle Scholar
- 24.A. Ammar, A. Farid, S. Fouad, Phys. B 307, 64–71 (2001)ADSCrossRefGoogle Scholar
- 25.S.S. Fouad, A.E. Bekheet, A.M. Farid, Phys. B 322, 163–172 (2002)ADSCrossRefGoogle Scholar
- 26.M. Iovu, D. Harea, E. Colomeico, M. Iovu, V. Ciorba, ROMOPTO, 2006: Eighth Conference on Optics, International Society for Optics and Photonics, pp. 67851E-67851E-67856 (2007)Google Scholar
- 27.R. Swanepoel, J. Phys. E Sci. Instrum. 17, 896 (1984)ADSCrossRefGoogle Scholar
- 28.S.S. Fouad, E.A.A. El-Shazly, M.R. Balboul, S.A. Fayek, M.S. El-Bana, J. Mater. Sci. Mater. Electron. 17, 193–198 (2006)CrossRefGoogle Scholar
- 29.P. Sharma, M. El-Bana, S. Fouad, V. Sharma, J. Alloy. Compd. 667, 204–210 (2016)CrossRefGoogle Scholar
- 30.S. Wemple, Phys. Rev. B 7, 3767 (1973)ADSCrossRefGoogle Scholar
- 31.S. Wemple, M. DiDomenico Jr., Phys. Rev. B 3, 1338 (1971)ADSCrossRefGoogle Scholar
- 32.H. Ticha, L. Tichy, J. Optoelectron. Adv. Mater 4, 381–386 (2002)Google Scholar
- 33.B. Derkowska, B. Sahraoui, X.N. Phu, G. Glowacki, W. Bala, Opt. Mater. 15, 199–203 (2000)ADSCrossRefGoogle Scholar
- 34.S. Fayek, S. Fouad, M. Balboul, M. El-Bana, Phys. B 388, 230–236 (2007)ADSCrossRefGoogle Scholar
- 35.M.R. Balboul, S.S. Fouad, S.A. Fayek, M.S. El-Bana, J. Alloy. Compd. 460, 570–576 (2008)CrossRefGoogle Scholar
- 36.S.S. Fouad, M.S. El-Bana, P. Sharma, V. Sharma, Appl. Phys. A 120, 137–143 (2015)ADSCrossRefGoogle Scholar
- 37.M.M. Tecklenburg, E. Larsen, B. Lita, D.I. Qadir, J. Non-Cryst. Solids 328, 40–47 (2003)ADSCrossRefGoogle Scholar
- 38.S. Hosokawa, Y. Hari, I. Ono, K. Nishihara, M. Taniguchi, O. Matsuda, K. Murase, J. Phys. Condens. Matter. 6, L207 (1994)ADSCrossRefGoogle Scholar
- 39.K. Inoue, T. Katayama, M. Kobayashi, K. Kawamoto, K. Murase, Phys. Rev. B 42, 5154 (1990)ADSCrossRefGoogle Scholar
- 40.J. Tauc, R. Grigorovici, A. Vancu, Phys. Status Solidi B 15, 627–637 (1966)ADSCrossRefGoogle Scholar
- 41.S. Fouad, G. Amin, M. El-Bana, J. Non-Cryst. Solids 481, 314–320 (2018)ADSCrossRefGoogle Scholar
- 42.T. Moss, C. Burrell, B. Ellis, Semiconductor opto-electronics (Wiley, New York, 1973)Google Scholar
- 43.S. Zhang, Y. Chen, R. Wang, X. Shen, S. Dai, Sci. Rep. 7, 14585 (2017)ADSCrossRefGoogle Scholar
- 44.R.R. Kumar, A. Barik, E. Vinod, M. Bapna, K. Sangunni, K. Adarsh, Opt. Lett. 38, 1682–1684 (2013)ADSCrossRefGoogle Scholar
- 45.J.I. Pankove, Optical Processes in Semiconductors. (Courier Corporation, North Chelmsford 2012)Google Scholar
- 46.N. Sharma, S. Sharda, V. Sharma, P. Sharma, Technol. Lett. 1, 9–11 (2014)Google Scholar
- 47.Q. Shen, K. Katayama, T. Sawada, T. Toyoda, Thin Solid Films 516, 5927–5930 (2008)ADSCrossRefGoogle Scholar
- 48.A.S. Hassanien, J. Alloy. Compd. 671, 566–578 (2016)CrossRefGoogle Scholar
- 49.M.S. El-Bana, S.S. Fouad, J. Alloy. Compd. 695, 1532–1538 (2017)CrossRefGoogle Scholar
- 50.M.S. El-Bana, I.M. El Radaf, S.S. Fouad, G.B. Sakr, J. Alloy. Compd. 705, 333–339 (2017)CrossRefGoogle Scholar
- 51.G. Cody, Semicond. Semimet. 21, 11 (1984)CrossRefGoogle Scholar
- 52.L.J.M. Herrera, D.M. Arboleda, D.C. Schinca, L.B. Scaffardi, J. Appl. Phys. 116, 233105 (2014)ADSCrossRefGoogle Scholar
- 53.K. Aly, F.M. Abdel-Rahim, J. Alloy. Compd. 561, 284–290 (2013)CrossRefGoogle Scholar
- 54.P. Nagels, L. Tichý, E. Sleeckx, R. Callaerts, J. Non-Cryst. Solids 227, 705–709 (1998)ADSCrossRefGoogle Scholar